IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis

IONTOF sales network

The IONTOF sales team aims at helping and supporting our potential customers to find the best solution for their specific problems.

Our sales team uses their own skills and expertise to solve issues and stay closer to the customer.

Our global sales organization enables us to deliver world-wide support on a local level.

For many years we have been working with agents from all over the world to take care of our potential customers.

IONTOF world-wide

For an IONTOF representative for you, please select the first of letter your country and then your country from the list.