89th IUVSTA Workshop, Zakopane, Poland
May 19 - 24, 2019
IUVSTA workshop will bring together leading scientists in electron microscopy, secondary ion mass spectrometry, atom probe tomography, cryo-spectroscopy and related technologies to address important challenges in biological and soft matter sample preparations for high-resolution imaging by high vacuum techniques.
Festkörperanalytik, Vienna, Austria
Jun 01 - 03, 2019
The “Festkörperanaltik” conference takes place alternately in Chemnitz and Vienna every two years. It serves to present analytical-methodical developments and scientific-technical solutions to problems in the context of investigations on solids in the form of invited lectures, short lectures and posters. The central concern is the exchange of ideas between analysts, materials scientists, solid-state physicists and technologists.
67th ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, USA
Jun 02 - 06, 2019
The annual conference presents over 2,700 poster presentations and 384 talks on Mass Spectrometry and allied topics. Outstanding speakers are already lined up to book-end our diverse set of parallel sessions and evening workshops. Hospitality suites will be nearby at the Omni CNN Center. The conference will conclude with another remarkable closing event scheduled for the Georgia Aquarium on Thursday evening. For IONTOF Nathan Havercroft will attend the meeting.
LEIS Workshop 2019, Enschede, The Netherlands
Jun 13, 2019
The annual European LEIS Users Workshop will be organised at the University of Twente. During this one day workshop, researchers involved in surface analysis with Low-Energy Ion Scattering (LEIS) and related techniques can exchange their most recent results and experiences. The aim is to provide an informal and effective platform for discussing the LEIS technique and promote the use of LEIS as an analytical tool for surface and thin film analysis with ultimate sensitivity. We invite researchers using LEIS and related techniques, scientists working on theory of ion scattering and researchers with interest for application of the LEIS technique to join this meeting.
LEIS Workshop 2019
UKSAF Surface Analysis Forum, Nottingham, UK
Jul 10 - 11, 2019
The UK Surface Analysis Forum (UKSAF) is a society for scientists from academia and industry with a common interest in the techniques and applications of surface analysis. The next 40th year anniversary meeting will be hosted by the NMRC at the University of Nottingham. Matthias Kleine-Boymann from the IONTOF sales team will attend the meeting together with Scanwel our UK agent.
UKSAF Surface Analysis Forum
ALD 2019, Bellevue, USA
Jul 21 - 24, 2019
The AVS 19th International Conference on Atomic Layer Deposition (ALD 2019) featuring the 6th International Atomic Layer Etching Workshop (ALE 2019) will be a three-day meeting dedicated to the science and technology of atomic layer controlled deposition of thin films and now topics related to atomic layer etching. Since 2001, the ALD conference has been held alternately in the United States, Europe and Asia, allowing fruitful exchange of ideas, know-how and practices between scientists. This year, the ALD conference will again incorporate the Atomic Layer Etching 2019 Workshop (ALE 2019), so that attendees can interact freely. For IONTOF Nathan Havercroft will attend the meeting.
ECASIA'19, Dresden, Germany
Sep 15 - 20, 2019
ECASIA will be held from 15th
September 2019 in Dresden, Germany. The ECASIA’19 conference will be organized by the Institute of Solid State and Materials Research (IFW Dresden) in cooperation with the Technical University Dresden (TUD) and other academic and industrial partners of the region. The ECASIA brings together scientists from universities, industry and instrument suppliers, to bridge the gap between fundamental and applied research in surface science.
Ion Beam Analysis 2019, Antibes, France
Oct 13 - 18, 2019
The IBA (Ion Beam Analysis) conference deals with the science, development, techniques and applications of energetic ion beams for analysis. For IONTOF Thomas Grehl and Hidde Brongersma will attend this meeting.
SIMS 22, Kyoto, Japan
Oct 20 - 25, 2019
International Conference on Secondary Ion Mass Spectrometry will be held in the historical city of Kyoto, Japan. The conference will provide a forum for colleagues from academia and industries to exchange results and new ideas on Secondary Ion Mass Spectrometry (SIMS) and related techniques. SIMS-22 will be held in conjunction with the 12th
International Symposium on Atomic Level Characterizations for New Materials and Deviced ’19 (ALC ’19).