ALD 2019, Bellevue, USA
Jul 21 - 24, 2019
The AVS 19th International Conference on Atomic Layer Deposition (ALD 2019) featuring the 6th International Atomic Layer Etching Workshop (ALE 2019) will be a three-day meeting dedicated to the science and technology of atomic layer controlled deposition of thin films and now topics related to atomic layer etching. Since 2001, the ALD conference has been held alternately in the United States, Europe and Asia, allowing fruitful exchange of ideas, know-how and practices between scientists. This year, the ALD conference will again incorporate the Atomic Layer Etching 2019 Workshop (ALE 2019), so that attendees can interact freely. For IONTOF Nathan Havercroft will attend the meeting.
JEMS 2019, Uppsala, Sweden
Aug 26 - 30, 2019
The Joint European Magnetic Symposia (JEMS) combine to form the most important and comprehensive conference on magnetism in Europe. The Symposia cover a broad range of topics addressing fundamental and applied magnetism, and novel magnetic materials. The symposia will take place at Uppsala Konsert & Kongress; the concert/congress hall of Uppsala, August 26-30 2019. For NanoScan and IONTOF Marco Corbetta will join the meeting.
ECASIA'19, Dresden, Germany
Sep 15 - 20, 2019
ECASIA will be held from 15th
September 2019 in Dresden, Germany. The ECASIA’19 conference will be organized by the Institute of Solid State and Materials Research (IFW Dresden) in cooperation with the Technical University Dresden (TUD) and other academic and industrial partners of the region. The ECASIA brings together scientists from universities, industry and instrument suppliers, to bridge the gap between fundamental and applied research in surface science.
Ion Beam Analysis 2019, Antibes, France
Oct 13 - 18, 2019
The IBA (Ion Beam Analysis) conference deals with the science, development, techniques and applications of energetic ion beams for analysis. For IONTOF Thomas Grehl and Hidde Brongersma will attend this meeting.
SIMS 22, Kyoto, Japan
Oct 20 - 25, 2019
International Conference on Secondary Ion Mass Spectrometry will be held in the historical city of Kyoto, Japan. The conference will provide a forum for colleagues from academia and industries to exchange results and new ideas on Secondary Ion Mass Spectrometry (SIMS) and related techniques. SIMS-22 will be held in conjunction with the 12th
International Symposium on Atomic Level Characterizations for New Materials and Deviced ’19 (ALC ’19).
AVS 66th, Ohio, USA
Oct 20 - 25, 2019
The AVS International Symposium and Exhibition addresses cutting-edge issues associated with materials, processing, and interfaces in the research and manufacturing communities. The weeklong Symposium fosters a multidisciplinary environment that cuts across traditional boundaries between disciplines, featuring papers from AVS technical divisions, technology groups, and focus topics on emerging technologies. The equipment exhibition is one of the largest in the world and provides an opportunity to view the latest products and services offered by 200+ participating companies. More than 2,000 scientists and engineers gather from around the world to attend.
PSA-19, Hokkaido, Japan
Nov 03 - 08, 2019
The 8th International Symposium on Practical Surface Analysis (PSA-19) is part of a series of international symposia on surface chemical analysis, covering the current status and future prospects of surface-analytical techniques in various practical and fundamental fields. Special emphasis is placed on challenges that arise during the application of surface-analytical techniques, including Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), Electron Probe Micro-Analysis (EPMA), Secondary Ion Mass Spectrometry (SIMS), and Scanning Probe Microscope (SPM), to a variety of technological materials. Practical issues encountered in applying these methods such as the need of reference materials, challenges of obtaining accurate depth profiles and three dimensional analysis, beam damage (by electrons, X-rays, and ions) and the importance of pre-standards activities and international standards (ISO) will be discussion. For IONTOF Dr. Marcus Terhorst will attend the meeting.
MMM 2019, Las Vegas, USA
Nov 04 - 08, 2019
The 64thAnnual Conference on Magnetism and Magnetic Materials (MMM) provides an opportunity to share your research and interact with a large and broad collection of magnetism researchers, and to learn about the most recent developments in the field. This conference will include basic and applied science and technology related to the field of magne-tism and magnetic materials. For NanoScan and IONTOF Marco Corbetta will attend the meeting.