IONTOF: TOF-SIMS / LEIS products with time of flight secondary ion mass spectrometry, low energy ion scattering, surface analysis, depth profiling, surface imaging, surface spectrometry, 3D analysis, retrospective analysis
The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer.
This new generation instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling.
Its unique surface sensitivity makes the Qtac the perfect tool to study surface processes. The Qtac provides valuable information in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, fuel cells, and biomaterials.
Qtac 100 stand-alone version
Key features are:
Quantitative, elemental characterisation of the top atomic layer
Spectroscopy, imaging and depth profiling capabilities
Time-of-flight mass filtering for improved sensitivity