First Francophone Users Meeting
May 24, 2011
Our first Francophone TOF-SIMS Users Meeting was held on the 12th May at the Chimie ParisTech, ENSCP, on the site where Marie Curie carried out her famous work. The high attendance of 40 people included those from almost all the Francophone TOF-SIMS sites as well as other users. Among the 40 participants were operators and analysts from France, Belgium, Luxembourg and Israel.
After a welcome by Professor Philippe Marcus, the Director of Research of the Laboratoire de Physico-Chimie des Surfaces, the programme of talks included a presentation by Dr. Markus Terhorst from IONTOF about the many new possible upgrades and additions to the TOF-SIMS instruments. After a buffet lunch giving the users a chance to meet and compare their experiences, the afternoon was devoted to presentations from the users themselves. The breadth of use of TOF-SIMS for surface analysis in many applications to organic and inorganic materials was well illustrated.
Another outcome of the Meeting was a general agreement of the users to support a centre of TOF-SIMS information being developed by Dr Roland Benoit of CNRS, Orleans. The website is
We were fortunate that Dr Anouk Galtayries of ENSCP was able to provide an excellent local organisation and our thanks go to her and her team.
It was decided to make the meeting an annual event and the next one will be at another site in Paris during May 2012. The meeting is conducted mainly in French, but of course no user is excluded. We will announce the details of the next meeting early next year.
LEIS Users Meeting
May 19, 2011
We are pleased to announce that the second LEIS Users Meeting will be held at the UCCS in Lille, France on 17th June 2011, following the first meeting held at Imperial College last autumn.
This meeting is aimed at researchers who use or plan to use LEIS in their research and would like to know more about the specifics of LEIS analyses.
The meeting will be divided into several scientific contributions from experts in the emerging field of Low Energy Ion Scattering (Prof. Hidde Brongersma, Philipp Brüner), from current users (Dr Sarah Fearn, Imperial College London, Dr. Anne-Sophie Mamede, UCCS) and will also include round tables in order to facilitate and develop discussions about spectra measurements with the Qtac 100 and data analysis.
If you would like to attend, please register on:
The full programme will soon be available on the website.
SIMS XVII Papers
Mar 25, 2011
The Wiley Online Library has published all papers from the 17th International Conference on Secondary Ion Mass Spectrometry. They can be downloaded free-of-charge from this website:
SIMS XVII papers
TOF-SIMS in Art Analysis
Feb 02, 2011
Summary of the chemical composition and localization obtained with an overlay of most of the TOF-SIMS results and showing the stratigraphy of the painting cross-section.
A group of European researchers, among them our TOF-SIMS user Dr. Alain Brunelle from CNRS, have used our equipment for an exciting new application: They studied Rembrandt’s famous 1641 masterpiece "The Portrait of Nicolaes van Bambeeck" to look for paint recipes used by the artist.
With the help of Dr. Brunelle's TOF-SIMS IV it was confirmed that Rembrandt actually applied wheat starch as a paint ingredient. This substance had not previously been found in any of Rembrandt’s artworks.
For more information please refer to:
J.Sanyova, S.Cersoy, P. Richardin, O. Laprévote, P. Walter, A. Brunelle, Analytical Chemistry, 2111,83, 753-760
Number of TOF.SIMS 5 exceeds 100
Jan 11, 2011
IONTOF is proud to announce that the very successful TOF.SIMS 5 has now been sold more than a hundred times. In December 2009 IONTOF received orders number 100 and 101. The hundredth instrument will be installed at the Ulsan National Institute of Science and Technology (UNIST) in South Korea.
SIMS Analysis Beyond the Static SIMS Limit
Dec 15, 2010
The spectra above show surface spectra before (red) and after (blue) sputtering with 10 keV Ar2500+.
SIMS is a well established technique for the analysis of polymers. Up to now the undisturbed organic information could only be measured at the polymer surface. The analysis of deeper polymer layers without losing a large fraction of the organic information was impossible. The new gas cluster ion source allows organic SIMS analysis far beyond the static SIMS limit.
We applied the new gas cluster ion source to different polymers with remarkable results. Even after intense sputtering to a depth of several microns, spectra of the intact polymer could be acquired.
The example below shows surface spectra before (red) and after (blue) sputtering with 10 keV Ar2500+. While the red spectrum shows some surface contamination in addition to the characteristic polystyrene peaks, the blue spectrum only shows the polystyrene peaks and no contamination. The blue spectrum was taken at a depth of 2 µm.
Ultimate Depth Resolution on the NPL Multilayer Structure
Dec 15, 2010
Depth profile of the NPL multilayer sample.
The Irganox 1010 / Irganox 3114 multilayer structure from NPL in the UK has become a kind of reference material for the evaluation of organic depth profiling performance. The sample is ideal for comparison of depth resolution using different analytical conditions.
With the new gas cluster ion source it is now possible to further improve the depth resolution achieved so far by using C60 sputtering under optimum conditions.
The example below shows a dual beam depth profile through the NPL multilayer structure using bismuth as analysis beam and a argon cluster as sputter beam. The layer thicknesses are 2.7 nm, 2.8 nm, 3.3 nm and 3.3 nm. We could measure an excellent depth resolution of < 5 nm (FWHM) with an upslope of < 1.2 nm.
OLED Application with the Gas Cluster Ion Source
Dec 15, 2010
Depth profile of an OLED like structure showing the depth distribution of the different molecules.
The analysis of organic multilayer structures is of high interest especially for researchers in the field of OLED technology. So far, TOF-SIMS depth profiling could only provide limited information about such samples.
With the new gas cluster ion source we could for the first time analyse these samples following the signals of the intact molecules. The example below shows a dual beam depth profile through an OLED like structure. All layers of the structure are well detected with a high sensitivity and depth resolution. We expect that the interest in this new application will be very high.
Product Announcement for New Gas Cluster Ion Source
Nov 05, 2010
The application of argon clusters in SIMS was pioneered by researchers at Kyoto University. Recently, this subject has been discussed in the SIMS community more intensively. Will this projectile represent a major step forward in organic depth profiling? Which other applications can be addressed using the new technology?
Today, IONTOF is happy to announce that our R&D team has nearly finished the development of a new high-performance gas cluster source for dual beam depth profiling. The source has been optimised for TOF-SIMS applications and our application team is enthused by the results.
IONTOF will officially launch the new gas cluster source on the 15th of December 2010. We will present more information about the new product and its application soon.
New Product Launch for the TOF.SIMS 5 Product Line
Nov 03, 2010
The TOF.SIMS 5 was officially launched in October 2003 and has meanwhile become the most successful TOF-SIMS instrument in the market. Nevertheless, our R&D team is permanently improving the performance of our instruments to extend the range of applications of the technique and to deliver the best product to the customer. The new series of products, which IONTOF launched during the SIMS Europe last month, are another milestone in our ongoing R&D efforts.
With the new 30 keV BI NANOPROBE IONTOF introduced the next generation bismuth cluster source to the market. The source provides 4x higher data rates, 4x higher current density in fast imaging mode and an ultimate lateral resolution of down to 60 nm.
The 20 keV C60 MICROPROBE has a completely new design. The source is optimised for high-end spectroscopy, imaging and depth profiling with C60.
IONTOF also presented the new FAST SAMPLE ROTATION and a new version of the SurfaceLab 6 software which includes a new spectra library.
If you would like to know more about the new products, please send your request to email@example.com.
Opening Ceremony at KIT
Nov 02, 2010
Dr Michael Bruns (left) and Dr Alexander Welle (right) from the KIT in Karlsruhe look forward to using the new TOF.SIMS 5.
The starting up of their new TOF.SIMS 5 was celebrated by the Karlsuhe Institute of Technology (KIT) on 27th October 2010.
During the event, Sven Kayser gave a talk on the development of SIMS and TOF-SIMS over the years, while Dr. Derk Rading gave a presentation on the technique and on possible applications.
This instrument is IONTOF's 200th on-site installation, so we contributed to the celebration by inviting all attendees to a reception with various refreshments afterwards.
Dr. Alexander Welle, our user at KIT, has already successfully completed some scientific tasks on his new TOF.SIMS 5 and we hope the instrument will continue to be a valuable means of research at Karlsruhe!
NanoScan Product Distribution
Oct 09, 2009
As previously announced, IONTOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.
NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).
We are pleased to inform that IONTOF GmbH will now channel all related marketing and sales efforts in Muenster. Together with the skilled scientists at NanoScan, the experienced IONTOF sales team is looking forward to extending the market for these extraordinary devices.
If you would like to receive further information, please contact firstname.lastname@example.org
Aug 06, 2009
SIMS XVII in Toronto, Canada is fast approaching. At the conference, we will have an exhibition booth where you will be able to obtain the latest information on our products. We will also contribute to the conference by giving various talks which we trust will be of great interest for the SIMS community.
Together with IONTOF USA we will host a users reception on Monday, 14th September 2009. A buffet style dinner will be provided and we have chosen a special location for this event - let us surprise you! We look forward to entertaining our customers and associates. If you have not yet registered for this event but would like to join us, please send an email to email@example.com
Fully refurbished IONTOF instruments for sale
May 27, 2009
We are pleased to announce that we have some used instruments for sale at the moment. There are older
TOF-SIMS IV type instruments available as well as instruments of the current type TOF.SIMS 5. The latter have previously been used as demonstration or R & D equipment.
Prices start from 200,000.00 EUR, depending on the configuration and on upgrades you may wish to purchase.
All instruments are in a very good condition and have undergone thorough functionality tests at IONTOF GmbH.
If you would like additional information or if you are interested in obtaining a quotation for any of the above-mentioned instruments please contact firstname.lastname@example.org.
IONTOF acquires majority of NanoScan shares
Apr 06, 2009
NanoScan: High Resolution Magnetic Force Microscope (hr-MFM)
We are pleased to announce that IONTOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.
NanoScan Ltd. is a spin-off company of the University of Basel. The company was set up in 2003, when the initiators at the Institute of Physics developed a prototype of their high-resolution Magnetic Force Microscope capable of enhancing the resolution by a factor of ten compared to other available microscopes.
Today, NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).
After the acquisition NanoScan will remain an independent company in Switzerland. Dr. Raphaëlle Dianoux has been appointed CEO and will lead the company together with Dr. Guido Tarrach as CTO. Both scientists have long-term experience in the development and the application of scanning probe microscopy.
This acquisition will grant IONTOF access to new technologies in the field of nanoscience, thus strengthening our position as a leading manufacturer of instrumentation for surface analysis. We are certain that our future product lines will benefit from these new technologies.
55th AVS Meeting 2008
Nov 05, 2008
The AVS 55th International Symposium and Exhibition was held recently in the USA in Boston, MA.
A Novel Bismuth-Manganese Emitter for G-SIMS Spectroscopy and Imaging (by Felix Kollmer)
Attended by around 3,000 people the week's symposium was a lively affair with lots of good scientific discussions and plenty of occasions to socialize too.
Three talks were presented by IONTOF personnel:
Latest Developments and Applications of the Qtac 100 for High Sensitivity LEIS (by Thomas Grehl)
Applications of TOF-SIMS and LEIS for the Characterization of Ultra-Thin Films (by Thomas Grehl)
These talks were well attended and all received a very positive response from the audience.
It was great to see so many familiar faces as well as meet some new ones, that we hope to see again in the near future.
SIMS IV China and ISSIMS 08 Beijing
Nov 04, 2008
The attendees of the event.
From 26th to 29th October 2008, the 4th Chinese Conference on Secondary Ion Mass Spectrometry (SIMS IV China) and the 2008 Beijing International Symposium on Secondary Ion Mass Spectrometry (ISSIMS 08 Beijing) took place in Beijing. IONTOF attended these events in co-operation with their local agent, GermanTech, and gave the following talks:
Recent Developments in TOF-SIMS and Low Energy Ion Scattering (LEIS)
Characterisation of Microstructures and Nanostructures by Cluster SIMS
Thin Film Characterisation with TOF-SIMS and LEIS
It was exciting to see the impressive level of SIMS activity in China. The conferences proved to be a good opportunity for exchanging knowledge and new ideas.
Users Meeting 2008
Sep 29, 2008
Photo: Allwetterzoo Münster
We held our fifth Users Meeting on 16th and 17th September, following SIMS Europe 2008. This was once again a perfect opportunity for exchanging information, news and ideas.
For the social evening, about 100 customers and staff visited the popular zoo of Muenster, which is well-known from television and surely one of the flagships among the town's places of interest.
During informative guided tours, we got a good look around the zoo which was already closed for the public at that time. Afterwards, we took our guests "under the sea" by inviting them to a delicious candlelight dinner buffet held at the aquarium.
On the following day, we assembled at the Technology Centre just opposite the IONTOF building. News of the company were presented and two users gave highly interesting presentations on their TOF-SIMS applications. Of course, their efforts were rewarded with a souvenir of Muenster.
Many attendees also took the chance to see our new product, the Qtac, which received a lot of interest during the Users Meeting and was one of the main topics addressed on that day.
It was a pleasure for us to meet so many of our customers here in Muenster and we are looking forward to seeing everyone again next time!
C&E News Cover
Apr 29, 2008
The cover of the April 21st 2008 edition of the American Chemical Society's C&E News magazine featured an IONTOF TOF-SIMS IV instrument.
The photograph from DOW Chemical's surface analysis lab shows Brandon Kern inserting a sample into the TOF-SIMS.
Although the article focuses on specialty chemicals, why not contact our Sales Department
to find out how we can help you in all areas of surface and materials research?
IONTOF at SIMS XVI
Dec 06, 2007
From 29th October until 2nd November 2007, we attended SIMS XVI – The 16th International Conference on Secondary Ion Mass Spectrometry in Kanazawa, Japan with several staff members.
We shared a booth with our local distributor, Hitachi High-Tech Trading. The main attraction on our stand was certainly the presentation of our exciting new product line, the Qtac, which gained a lot of interest from the SIMS community.
It was a pleasure for us to invite our users to a Buffet Dinner during the event. We hope that all of our guests had a good time; we very much enjoyed seeing so many customers in Japan.
IONTOF and TASCON GmbH were represented at SIMS XVI with the following contributions:
“Effect of Primary Ion Mass and Composition on the Secondary Ion Emission from Cesium Implanted Surfaces“ (E. Niehuis, T. Grehl, F. Kollmer, R. Moellers, D. Rading – oral presentation)
“Fundamental Studies on the Emission of Secondary Ions from Molecular Surfaces Using Bismuth and C60 Cluster Ion Beams“ (F. Kollmer, R. Moellers, D. Rading, E. Niehuis – oral presentation)
“Matrix Effects and Information Depth under Polyatomic Bombardment“ (R. Kersting, M. Fartmann, D. Breitenstein, B. Hagenhoff – oral presentation)
“Depth Profiling of Organic Materials Using Improved Ion Beam Conditions“ (H.-G. Cramer, T. Grehl, F. Kollmer, R. Moellers, E. Niehuis, D. Rading – oral presentation)
“The Chemical Composition of Animal Cells Reconstructed from ToF-SIMS 2D as well as 3D Analysis“ (D. Breitenstein, B. Hagenhoff, R. Moellers, J. Wegener – oral contribution during the discussion session)
“Applications of Time-of-Flight Secondary Ion Mass Spectrometra (ToF-SIMS) in the Static and in the Dynamic Mode for Surface Analysis of Flat Steel Products“ (G. Mueller, F. Stahnke, M. Raulf, S. Kayser – oral presentation)
“Composition of Surfaces: A Comparison of LEIS and ToF-SIMS“ (D. Breitenstein, R. Kersting, B. Hagenhoff, R. ter Veen, H. Brongersma – poster presentation)
“Application of TOF-SIMS for for High Precision Ion Implant Dosimetry: Possibilities and Limitations“ (T. Grehl, R. Möllers, E. Niehuis, D. Rading – poster presentation)
After this interesting and successful conference in Japan, we are very much looking forward to meeting you again at SIMS Europe 2008, which will take place in Muenster/Germany from 14th-16th September 2008.
New Product Launch
Oct 16, 2007
Professor Hidde H. Brongersma
IONTOF is launching an exciting new surface analysis instrument, the Qtac100. The new product will be presented at
, Seattle, USA,
SIMS XVI and
ALC'07, Kanazawa, Japan.
The Qtac100 is a high sensitivity low energy ion scattering (LEIS) instrument able to chemically and quantitatively analyse the very top atomic layer of the sample, unlike all other surface analysis techniques, which integrate over several layers. This surface analysis instrument makes a significant addition to the range of instruments available to the surface analyst, and will quickly be established as an essential part of a comprehensive surface science laboratory.
This is a result of the collaboration with Professor Hidde Brongersma, a pioneer of LEIS and its applications firstly at the Technical University of Eindhoven, and then at Calipso BV.
The combination of Professor Brongersma’s expertise and IONTOF’s well established technologies have produced a powerful instrument for top atomic layer spectroscopy, surface chemical mapping, and both static non-destructive depth profiling and dynamic sputter depth profiling.
Applications are found particularly for catalysts, fuel cells, semiconductors, surface modification, thin layer pinhole detection, atomic resolution depth profiling, or any application requiring atomic layer analysis.
For more information about this unique instrument, please use the enquiry form on our
Contact Page or have a look at our Product Section.
An IONTOF TOF-SIMS is good for the brain
Sep 27, 2007
On page 28 of the August 27th 2007 issue of
(Chemical and Engineering News) the top ten chemical companies in patent achievement for this year are listed. A section of the annual list compiled by The Patent Board can be read
for non ACS subscribers.
Is it a coincidence that eight of the top ten all own an IONTOF TOF-SIMS instrument?
Why not contact our sales staff
to find out how we can help you in all areas of surface and materials research?
Unusual Uses for TOF-SIMS
Sep 27, 2007
Since its early days TOF-SIMS has been a versatile technique, but recently an even wider range of samples have been analyzed. The advent of such technologies as the Bismuth liquid metal ion gun has seen TOF-SIMS used routinely for imaging and depth profiling of organic and biological materials. However, Dr Rana Sodhi and his colleagues at the University of Toronto may just have come up with the most unusual samples yet.
In a study shown on the Discovery Channel’s Conspiracy Test program the University of Toronto team used an IONTOF TOF-SIMS IV in the investigation into claimed extraterrestrial materials. Originally aired on August 14th, the “Alien Abduction” show follows a study of metallic samples recovered from the bodies of claimed alien abduction victims. By combining TOF-SIMS and FE-SEM, the materials research group at Toronto was able to successfully determine the origin of these materials. So were they alien in nature? Well you’ll have to watch the show to find out! For those of you who missed the show it will be repeated on October 24th at 1pm ET.
A small preview can be seen here on YouTube.
Grand opening of the new “Christian Doppler Laboratory for Surface and Interface Analysis with TOF-SIMS” at the Technical University Vienna
May 16, 2007
Prof Hartmut Kahlert, Prof Reinhart Kögerler, Dr Stephan Schmidt-Wulffen, Prof Wolfhard Wegscheider, Prof Johannes Fröhlich, Dr Evelyn Nowotny, Prof Peter Skalicky, Prof Alfred Benninghoven, Prof Herbert Hutter during the opening ceremony.
Last year the Technical University Vienna decided to invest in a new surface science instrument and purchased a new high configuration TOF.SIMS 5. This instrument is now the most important tool for Prof Herbert Hutter and his team and the key instrument for the new Christian Doppler Laboratory for Surface and Interface Analysis with TOF-SIMS.
The Laboratory was officially opened last week, and the ceremony was attended by notable people from the Science and Development Ministry, Christian Doppler Research Association (CDG), AT&S, the University and the surface science community.
The Christian Doppler Research Association named after the Austrian physicist and mathematician, Christian Andreas Doppler, is a non-profit association whose aim is to promote the development in the areas of natural sciences, technology and economy as well as their industrial implementation and utilisation.
The new laboratory will be supported by CDG and AT&S and will focus on applied research for the development of printed circuit boards. AT&S is the European market leader for printed circuit boards and one of the world’s largest producers.
CDG and AT&S will generously fund Prof Hutter and his team with 770,000.- Euros over the next seven years.
Job Opportunity for a Field Service Engineer
Apr 03, 2007
Providing effective and reliable customer support is one of the key factors for our continuously growing market success. In order to strengthen our support team for future challenges, we are pleased to announce that we are looking for an additional service engineer. If you are interested in details on this position, please refer to
2006 - The most successful year in IONTOF’s history
Mar 02, 2007
The new TOF.SIMS 300 R inside the CNT clean room in Dresden, Germany. With this first fully-automated tool, we strengthened our position as the preferred partner for the application of TOF-SIMS in the semiconductor industry.
Although the very fast moving economy of today hardly ever allows a moment to look back, the turn of the year always provides a good opportunity for reviewing all that happened during the last twelve months.
Going over the figures for last year was very satisfying: We are very proud to announce that 2006 was the most successful year in our history so far. We increased our sales to a highly satisfactory number of instruments in the past year. In addition to further developing the historically strong markets such as USA, Europe and Japan, we also managed to enter new ones in 2006.
Our market success is mainly based on the TOF.SIMS 5 product line and its field-proven performance, which is still unmatched. Up to now, we have installed more than 50 TOF.SIMS 5 instruments worldwide. In 2006, we also introduced a new TOF-SIMS instrument to the market, the TOF.SIMS 300 R. With this first fully-automated tool, we strengthened our position as the preferred partner for the application of TOF-SIMS in the semiconductor industry. The first machine has already been successfully installed at the Center for Nanoelectronic Technology (CNT) in Dresden, Germany.
Not only have we made technological progress during the last year, but we also continued to put effort into our services. The last enhancement was the introduction of the WebexTM online support, which was successfully tested in 2006 and officially launched five weeks ago (see news of 21.01.2007: "Professional help on-site in an instant").
Looking back on such a good year, we are very much looking forward to rising to the new technical and commercial challenges during the year 2007.
Professional help on-site in an instant
Jan 24, 2007
Professional service is a key factor for all our customers. High uptime, fast response, low maintenance costs and an excellent helpdesk are essential for meeting the demands of the modern industry. Therefore, the IONTOF Service is continually improving its structure, functions and offered services.
Today IONTOF expands its services to a new form of on-line support. With this new service, professional help is just a mouse click away. In addition to the on-line support via VPN, IONTOF now offers on-line support via WebexTM. This new technology enables our service engineers to check the systems on-line while the customer can follow all actions and discuss the problems simultaneously. With WebexTM the engineer can also efficiently assist the customer with all kinds of operational questions.
For further information on this new service, please contact our Support Team.
Annual Japanese TOF-SIMS Seminar and User Meetings
Dec 13, 2006
Following the long-term tradition of holding TOF-SIMS seminars in Japan, Hitachi High-Tech Trading Corp., in co-operation with IONTOF GmbH, organised this year's TOF-SIMS Meeting on 28th November 2006.
This time, Hitachi chose the Tokyo Conference Center in Shinagawa as the location for the seminar, which was attended by about 80 people. In addition to a general introduction into TOF-SIMS, Dr Markus Terhorst and Dr Derk Rading from IONTOF GmbH gave an update on the latest instrumental and applicational developments, including information about
the new TOF.SIMS 300 R.
The Japanese user meetings were held in the new demonstration facility, the Takanawa Science Laboratory. During the two days, the Hitachi demonstration team, Dr Terhorst and Dr Rading were available for an intense exchange of experiences.
Both the seminar and the User Meeting have been very fruitful for the customers and ourselves. We hope that the attendees share our opinion and would like to thank them for participating.
If you would like further information about our customer support in Japan, please contact:
Hitachi High-Tech Trading Corporation
Takanawa Science Laboratory
SIA Takanawadai Bldg.
3-5-23 Takanawa, Minato-Ku
IONTOF Users Meeting 2006
Oct 11, 2006
Txell Sust & August Tharrats Blues Trio performing at the Hot Jazz Club.
The number of our Users is growing rapidly, and we will continue to invite them to our Users Meetings for an intense two way exchange of information and comment.
Our fourth Users Meeting was held immediately following SIMS Europe 2006.
The first event was the social evening. The venue was, as usual, kept a secret until the buses took about 90 customers and staff to the Hot Jazz Club at the harbour of Münster, which was booked exclusively for IONTOF that night.
After an excellent buffet dinner, we were entertained by the Spanish Jazz band ”Txell Sust & August Tharrats Blues Trio“ and their very attractive singer. The band‘s enthusiastic and top class performance, the typical low-ceiling jazz club atmosphere, and the previously unknown musical and dancing talents displayed by some of the audience, provided a great evening in good company.
On the following day, we assembled at the Technology Centre just opposite the IONTOF building for a programme of talks and discussions. IONTOF staff presented news of the company and gave a thorough and extensive overview of the most recent technical developments.
Five of the users gave very interesting presentations on their establishments and TOF-SIMS applications, ranging from cell chemistry to semiconductor trouble shooting, and were rewarded with a gift in appreciation of their efforts. A tour of the factory and the opportunity of personal discussions with our experts finished off the day.
New Instrument Demo Laboratory in Japan
Aug 18, 2006
The Team of the Takanawa Science Laboratory
We are pleased to announce the opening of a new instrument demonstration facility in the Shinagawa area, Tokyo, Japan on 10th April 2006.
Equipped with a new TOF.SIMS 5-100 and a TOF.SIMS 5-300, this laboratory is perfectly prepared for the analysis of all kinds of samples. All up-to-date features, such as analysis with Bismuth or C60
, are available.
We have had demonstration facilities in Japan since 1996, but this new laboratory is a great improvement in terms of consolidating service activities, applications and analysis tasks. Moreover, the traffic connection of the Takanawa Laboratory is very convenient which will allow a quicker reaction in many cases, especially for service tasks.
The team of the Takanawa Science Laboratory, which is supervised by Mr Osamu Mimaki, has also been strengthened by the employment of an additional service engineer and an application scientist.
Anyone in Japan considering the investment in a TOF-SIMS instrument is welcome to arrange a demo visit to the laboratory in Takanawa with our local representatives:
Hitachi High-Tech Trading Corporation
Takanawa Science Laboratory
SIA Takanawadai Bldg.
3-5-23 Takanawa, Minato-Ku
Of course, the laboratory also continues to deal with service analysis tasks. In this sector, the team has more than ten years of experience.
We are proud of our contribution to this sophisticated analysis and demonstration facility and hope that it will be of good help in further developing the successful Japanese TOF-SIMS market.
TOF-SIMS in Cell Chemistry
Aug 09, 2006
The TOF.SIMS 5 is being increasingly used in biomedical research and recently in particular in cell chemistry. The main reason for this is the introduction of the Bismuth primary ion source which constitutes a big improvement in performance for molecular analysis and enables sub-micron organic molecule mapping, a key requirement. MALDI users are limited to mapping resolutions in the order of some microns, and they see TOF.SIMS as a useful complimentary technique.
TOF-SIMS cell chemistry articles are now appearing in high quality journals:
MICROSCOPY RESEARCH AND TECHNIQUE
Nygren, H.; Börner, K.; Malmberg, P.; Tallarek, E.; Hagenhoff, B.: Imaging TOF-SIMS of Rat Kidney Prepared
by High-Pressure Freezing. In: Microscopy Research and Technique, 68, 2005, pp. 329–334.
JOURNAL OF MASS SPECTROSCOPY
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
Brunelle, A.; Touboul, D. and Laprévote, O.: Biological tissue imaging
with time-of-flight secondary ion mass spectroscopy and cluster ion
sources. In: Journal of Mass Spectroscopy, 40, 2005, pp. 985-999.
Touboul, D.; Kollmer, F.; Niehuis, E.; Brunelle, A. and Laprévote, O.:
Improvement of Biological Time-Of-Flight Secondary Ion Mass Spectrometry
Imaging with a Bismuth Cluster Ion Source. In: Journal of the American
Society for Mass Spectrometry, 16, 2005, pp. 1608-1618.
Sjövall, P.; Lausmaa, J.; Johansson, B.: Mass Spectrometric Imaging of Lipids in Brain Tissue. In: Anal. Chem., 76, 2004, pp. 4271-4278.
Breitenstein, D.; Batenburg, J. J.; Hagenhoff, B.; Galla, H. J.: Lipid Specificity of Surfactant Protein B Studied by Time-of-Flight Secondary Ion Mass Spectrometry. In: Biophysical Journal, 91, 2006, pp. 1347-1356.
In addition the Editor of the Journal of the American Society for Mass Spectrometry chose a rat brain image taken with a TOF.SIMS 5 for the front cover of Volume 10, Issue 16 (see also the News about: J. Am. Soc. Mass. Spectrom. publishes a biological TOF-SIMS paper in the News Archive 2005).
Any readers interested in this TOF-SIMS application should go to our contact page and send an enquiry. More papers on this subject are promised and we will keep you informed via this news page.
Patented Key Technology for TOF-SIMS - Bismuth Cluster Ion Source
Apr 18, 2006
We are happy to announce that a patent has been granted for the application of Bismuth Clusters in SIMS (DE 10339346). Announced in 2004, the Bismuth source has meanwhile become the standard primary ion source on all new IONTOF systems.
The Bismuth ion source is the only ion source in the field which provides optimum performance for both organic and inorganic TOF-SIMS applications. It combines the fundamental benefits of cluster ion bombardment, such as superior efficiency and sensitivity, with a high brightness source. This allows unique data rates, lateral and mass resolution.
This source has given IONTOF a clear technological lead in the SIMS market place, and we are pleased that the new ion source technology is replacing the Gallium or Gold primary ion sources. The flexible design of our instruments has enabled many of our users to upgrade their instruments to the new Bismuth source already.
If you would like to learn more about the Bismuth cluster ion source please go to information request.
Start-up for TASCON USA, Inc.
Mar 06, 2006
TASCON USA's laboratory, equipped with a TOF.SIMS 5-300.
Our sister company TASCON GmbH has recently formed its American subsidiary TASCON USA, Inc. in order to meet the increasing demand for high quality analytical services and consulting, and to provide more direct and faster replies to all enquiries. TASCON GmbH has acquired a very good reputation for the thoroughness of its investigations, and has built up a wide experience of sample systems and how to analyse them with TOF-SIMS. TASCON USA, Inc. will benefit from this acquired expertise.
TASCON USA is based in Chestnut Ridge, NY, next door to IONTOF USA, Inc. In Europe IONTOF uses TASCON GmbH as an application laboratory for selling and demonstration work, and this close co-operation has been very successful for many years. We have set up the same arrangement in Chestnut Ridge, so American customers can see a professional instrument demonstration in America.
The main contact person at TASCON USA is the very experienced application scientist Dr Albert Schnieders, who is well-known by many of our customers from his long-term service activities for IONTOF USA, Inc. A new TOF.SIMS 5-300 instrument has now been installed in Chestnut Ridge. This instrument has the optimum configuration for surface spectroscopy, chemical mapping and depth profiling, and will be available for both new customers requiring analytical service and existing customers with too much work for their own instruments.
We know that many analysts in North America, both with and without their own TOF-SIMS, have been looking forward to the improved possibilities resulting from this new TASCON laboratory.
For further information, please contact TASCON USA, Inc. at the following address:
TASCON USA, Inc.
100 Red Schoolhouse Road
Chestnut Ridge, NY 10977
CSMA Invest in the Future
Feb 10, 2006
CSMA, the UK materials analysis service company in the CERAM group, have recently taken delivery of a TOF.SIMS 5. It will be used by CSMA's team of specialist surface scientists in surface characterisation and
troubleshooting for a wide range of industries, including; pharmaceuticals, packaging, food, housewares. It will also help ensure that CSMA, which is part of CERAM, retains a world ranking position in
this area of technology.
CSMA already has many of the world's blue chip pharmaceutical, medical device, semiconductor and automotive and aerospace companies as its clients, and is now enjoying a period of development and expansion. This is being driven by the demands of its clients to perform ever more technologically demanding applications, looking at new product
developments as well as technological support for patent claims.
The company has been involved in assisting developments in a broad range of applications from innovative drug encapsulations, cardiovascular stents, orthopaedic implants, laser surface cleaning studies for aerospace, proteins on surgical instruments etc.
The technology is not confined to large high tech companies however, as, through its parent company CERAM, CSMA is able to offer its services to many smaller companies with support from local agencies
such as the UK's Advantage West Midlands.
Keep your samples clean - glove box on a TOF-SIMS IV
Feb 10, 2006
The TOF-SIMS IV at ICI Measurement Science Group with the new customised glove box.
Dr Ian Fletcher from ICI Measurement Science Group is not only an expert in Cricket. Everybody who has visited the vendors' talks during SIMS XV knows this already. He is also a man of practical and efficient solutions. This time he wanted to quench freeze samples in Nitrogen slush and avoid any condensation on the sample surface before the sample is safely in the evacuated loadlock. Therefore he has designed a practical glove box for his TOF-SIMS IV.
The glove box is constructed of acrylic sheet with a simple flexible interface to the TOF-SIMS IV airlock and ports for gloves so that samples can be handled inside the box. The space inside the glove box is easily sufficient to accommodate a nitrogen slush device, and any other sample preparation requiring an inert atmosphere. The box is flushed continuously with high purity Nitrogen gas to remove air and water.
Many samples will benefit from the clean sample preparation, for instance organic tissue and surface modified materials.
If you would like to learn more about customised configurations for the TOF.SIMS 5 please go to IONTOF Customised Configurations
Surface Microscopy and Microanalysis in Materials and Biological Systems
Feb 07, 2006
IONTOF user Vincent Smentkowski, with the help of Professor Luke Hanley, is organizing a symposium at the Microscopy and Microanalysis 2006 conference. Entitled Surface Microscopy and Microanalysis in Materials and Biological Systems, the symposium will cover a broad range of material, with invited talks emphasizing state of the art surface analytical instrumentation, advanced data analysis tools, and the use of complimentary surface analytical instrumentation to perform a complete analysis of complex materials and biological systems. Also up for discussion are current and future surface analytical challenges.
Microscopy and Microanalysis 2006 (MM2006) will be held July 30-August 3, 2006 in Festival Hall at Navy Pier, Chicago IL. It is one of the premiere meetings of the year for scientists and technologists interested in learning about the latest advances in applications and techniques for the analysis of a broad range of materials in the biological and physical sciences, as well as nano- and bio-technology.
Meeting attendees are urged to contribute both platform and poster presentations to supplement the invited talks. It should be noted that extended abstracts are due on Feb 15, 2006 and can be submitted on-line at http://bono.cup.org/.
Travel awards are available for students.
More information can be found at,
Dr. Albert Schnieders of IONTOF USA will be giving an invited talk and IONTOF user Professor Tom Beebe will be discussing his innovative work with surface analysis techniques in the neuroscience field.
Stardust is back and Dr Thomas Stephan from the University of Muenster will be one of the first scientists to analyse the new samples
Jan 17, 2006
This composite image was taken by the navigation camera during the close approach phase of Stardust's Jan 2, 2004 flyby of comet Wild 2. Several large depressed regions can be seen. Comet Wild 2 is about five kilometers (3.1 miles) in diameter. To create this image, a short exposure image showing tremendous surface detail was overlain on a long exposure image taken just 10 seconds later showing jets. Together, the images show an intensely active surface, jetting dust and gas streams into space and leaving a trail millions of kilometers long. (taken from the Stardust homepage)
Launched in 1999, the Stardust spacecraft has travelled a long way for over seven years to its comet encounter. On Jan. 2, 2004, Stardust flew past the nucleus of comet Wild 2 at a distance of 240 kilometres (149 miles). During this close flyby, a special collector captured particles of the comet as the spacecraft flew through the coma, or cloud of dust and debris, surrounding Wild 2. Two years and 13 days after this first-of-its-kind cometary sample mission, the Stardust spacecraft ejected a capsule that descended into the desert of Utah on the 15th January 2006.
Now after the successful touch down of the capsule, Dr Thomas Stephan and his team are waiting for the important new sample. They will be one of the first of six groups to have a closer look at the collected particles. Dr Thomas Stephan has long experience in the TOF-SIMS analysis of extraterrestrial particles and will use his TOF-SIMS IV for the new valuable samples. We are proud that our instrument might help to find out more about our origins.
"Ten years of planning and seven years of flight operations were realized early this morning when we successfully picked up our return capsule off of the desert floor in Utah," said Tom Duxbury, Stardust project manager at NASA's Jet Propulsion Laboratory, Pasadena, Calif. "The Stardust project has delivered to the international science community material that has been unaltered since the formation of our solar system."
Comets are believed to be the oldest, most primitive bodies in the solar system, possibly comprised of some of the basic building blocks of life. They contain the remains of materials used in the formation of stars and planets, holding volatile, carbon-based rich elements that are likely to provide clues about the nature of the building blocks of our solar system. Importantly, they may provide evidence that comets brought water to the Earth, making possible life.
With the prospect of comets offering this treasure house of ancient information, there is significant anticipation about what findings scientists will be able to extrapolate from a firsthand examination of cometary materials. There is a real possibility of scientific findings that will change the way we view our origins.
For more information go to:
Materials Research Society Fall Meeting, Boston, MA
Dec 14, 2005
The IONTOF booth at the MRS 2005 Fall Meeting in Boston, MA.
Nathan Havercroft from IONTOF USA and Sven Kayser from IONTOF GmbH recently attended the Materials Research Society 2005 Fall Meeting in the Hynes Convention Center, Boston, MA.
Meeting highlights can be seen at the MRS web page, but included a fashion show entitled, 'Wearables Runway – A Revolution in Textiles' that highlighted clothing made possible by Materials Research.
We would like to thank everyone for stopping by the IONTOF booth and the scientific poster presented by Nathan Havercroft.
American Vacuum Society 52nd International Symposium and Exhibition, Boston, MA
Nov 10, 2005
The IONTOF booth at the 52nd Annual AVS Symposium in Boston, MA.
Recently representatives from both IONTOF USA and IONTOF GmbH attended the 52nd Annual AVS International Symposium and Exhibition in the Hynes Convention Center, Boston, MA.
The symposium which ran from October 30th through November 4th has a large number of concurrent scientific sessions discussing the latest scientific breakthroughs. With over 2,000 attendees this years symposium was on a level with the previous show in Anaheim, CA.
The Exhibition which ran from October 31st through November 2nd is one of the world's major trade shows for surface analysis and vacuum technology exhibits. There were over 160 companies displaying their latest products and services. We would like to thank everyone for stopping by the IONTOF booth, it was great to see all the old faces as well as some new ones too.
TOF-SIMS Training Courses
Nov 09, 2005
The trainees of our two courses, mentally saturated with technical information, but still smiling.
We are currently running training courses in the operation of TOF-SIMS instruments and in data interpretation. These are sponsored by the European Union under the FP6 research programme, although the course content is the responsibility of IONTOF GmbH. The courses are open to anyone in the European Union who has recently joined a TOF-SIMS laboratory or received a TOF-SIMS instrument.
We decided that some hands-on training was necessary and so we are limiting each group of trainees to six people. Dr Derk Rading, our Senior Application Scientist, one of whose normal roles include customer training, was the ideal choice as the course organiser and principle teacher. After an introductory seminar on the first day, two days are spent in a TOF.SIMS 5 laboratory learning to use the instrument itself, followed by a second seminar on the fourth day to study the data evaluation software.
The final formal event is to present each trainee with a certificate of completion of the course, which we hope will serve them well in the future.
For the informal events, on the final evening we make a short tour of Muenster before a dinner in the "Pfefferkorn" restaurant in the historical center of Muenster.
The first two courses took place in October 2005. Our first group was a European mixture from France, Italy and Germany. The second course was attended by trainees from Germany, the Netherlands and Luxembourg.
Anyone who would like to participate in these training courses, please contact Claudia Schirdewan for further details or to have their names added to the waiting list.
SIMS XV: Conference and Exhibition
Oct 19, 2005
The SIMS community is fortunate to have its own international and
regional Conferences, unlike the majority of the other surface analytical
techniques. The main event is the International SIMS Conference,
biennial, which locates in turn in Europe, Asia and North America. Mid
September saw the International Meeting, SIMS XV, being held in
Manchester, UK, which was attended by 400 delegates from many countries.
A main theme of SIMS XV was the application of cluster sources, liquid
metal Bismuth and C60, and in particular the use and potential for
biological molecular imaging. TASCON, our sister company, showed 3D
molecular mapping of cells for the first time at a SIMS Conference, and
IONTOF demonstrated the versatility of the cluster Bismuth source for
all TOF-SIMS applications. We had many visitors to our Exhibition stand
asking for information about cluster sources. Those who already possess
a TOF-SIMS, however equipped only with a mono-atomic Gallium source, were
very keen to know the price of the upgrade to a cluster Bismuth source.
Bismuth has become the source of first choice for new TOF-SIMS customers.
If you want the details of the very significant advantages of Bismuth
over other sources, please use our contact page on this web-site.
J. Am. Soc. Mass. Spectrom. publishes a biological TOF-SIMS paper
Oct 19, 2005
Overlay of negative secondary ion images obtained from a rat brain section under the irradiation of Bi3+ primary ions. red : m/z 255 + 283, green: m/z 892, blue: m/z 771
We are pleased to note that on the front cover of the October issue of
the Journal of the American Society for Mass Spectroscopy there is an ion
image, taken with a TOF-SIMS IV fitted with a Bismuth source, showing the
distribution of three different lipids in a section of a mouse brain (D. Touboul, F. Kollmer, E. Niehuis, A. Brunelle, O. Laprévote, J. Am. Soc. Mass Spectrom. 16 (2005) 1608-1618)
Three of the authors work at the Institut de Chimie des Substances
Naturelles, CNRS, Av. de la Terrasse, 91198 Gif-sur-Yvette Cedex,
France. This laboratory is a very experienced MALDI laboratory, and
Alain Brunelle, a Physicist turned cell biologist, together with his biologically
trained colleagues, saw the potential of TOF-SIMS as a complimentary
technique to MALDI. Their justification and enthusiasm was sufficient enough
for their organisation to buy a TOF-SIMS from us, and they continue to
carry out innovative work applying TOF-SIMS to cell chemistry. An
increasing number of papers from this group and others are being
published showing results for biological and pharmaceutical
applications, as a consequence of the introduction of cluster ion
sources to the TOF-SIMS technique.
The Journal web-site advises that reprint requests should be addressed
to Dr. Alain Brunelle at the CNRS.
Anyone who is interested in exploring the possibilities of TOF-SIMS for
biological applications should e-mail us via the contact page on this
TASCON grows and broadens its analytical expertise.
Jul 01, 2005
Founded in 1997 IONTOF’s sister company for analytical service, TASCON, has achieved constant growth. Offering high quality analytical service and consulting for all kind of surface and sub-surface analytical tasks, TASCON has become a trusted partner for many European companies. The enlargement of the TASCON analytical team at the beginning of 2005 has further broadened its analytical expertise. Today you will find physicists, chemists, biologists, biochemists and geologists working successfully in close co-operation to solve customer problems.
Last year TASCON took delivery of a new 300mm sample size instrument, the TOF-SIMS 5-300, and cluster beam ion sources. The 300mm instrument allows them to offer better service to the 300mm semiconductor industry, and consequently increase their depth profiling business. The cluster beam sources have dramatically increased efficiency for molecular species giving sub-micron spatial resolution for surface mapping and better spectroscopy, and many customers have demanded more of such analyses, providing a big new business area for TASCON. The combination of depth profiling and surface mapping provides a means of 3D rendering, and these are ideal analyses for overnight automated operation. So TASCON’s customers, in addition to the traditional static SIMS analyses are increasingly asking for more surface mapping, depth profiling and 3D rendering
Originally equipped with Gold cluster beam sources, for over a year TASCON has also been the test laboratory for the new Bismuth Cluster ion source, and the new source is now being used for nearly all their analytical applications. The Managing Director, Birgit Hagenhoff, says, “ the faster data acquisition using Bismuth, compared to Gold, has made a significant improvement in TASCON’s output, and the cluster sources have given the company lots more market opportunities”
TASCON’s reputation for providing sound and thoroughly worked analytical reports is becoming more apparent to a discerning market. Often important design or production decisions are based on the results. TASCON will surely keep growing.
First TOF.SIMS 5 in South Africa
May 18, 2005
We are very pleased to announce our first order from South Africa. A TOF.SIMS 5 will be delivered to the CSIR (Council for Scientific and Industrial Research,
towards the end of 2005. It will be installed in the Department of Science and Technology for Nanotechnology Capacity Building. Contacts are
Martin van Staden
The applications will be many and various, since the CSIR is a national facility.
The CSIR is the largest community and industry directed scientific and technological research, development and implementation organisation in Africa and currently undertakes approximately 10 per cent of all research and development work on the continent.
It was established by the South African Government in 1945, and by providing technology solutions, plays an integral part in the development of South Africa. Much of its research and development, and technology transfer is market-driven, to support the economy and improve the quality of life of all South Africans.
The CSIR's staff complement of over 3 300 include scientists, engineers, technologists, technicians, sociologists and support staff and are at the forefront of research and implementation as part of the global scientific and technological community.
Less than a decade ago, the CSIR set out to transform itself in the technology partner of the people of South Africa. From being almost completely dependant on government funding before the restructuring of the organisation in 1987, when its Parliamentary Grant income represented 70 per cent of total income, the CSIR has demonstrated its ability over the past eight years to steadily grow its external income as a contract research organisation and now derives close to 60% of external revenue from the private sector. The turnover for the CSIR group was in excess of R850 million in the financial year ending March 2001.
CSIR technical enquiries: +27 12 841-2000
We are sure that the TOF.SIMS 5 will make a contribution, especially assisting South African industry with surface analysis applications.
If you would like more information from IONTOF, please contact our local agent Richard Holton at Vacutec, Tel +27 11 476-4202, vacutec@
SIMS Workshop 2005
May 18, 2005
Market demand for Ion Sources in per cent. Please note that all IONTOF instruments sold so far in 2005 are equipped with a Bismuth source.
The Annual SIMS Workshop was held at the Hilton Head Marriot Hotel in South Carolina. Attendance of about 100 makes this meeting the third biggest dedicated SIMS event in the calendar after the biennial SIMS Conference and SIMS Europe. A wide variety of SIMS topics were presented, but the major topic was the continued development and exploration of cluster primary ion sources, in which naturally IONTOF was prominent.
An examination of our sales statistics before the meeting showed that the Bi liquid metal ion gun has now become the analytical source of first choice for TOF-SIMS, and results presented by users at the Workshop confirmed this.
The developers are very excited by the possibilities of the C60
ion source and in particular some interesting results from depth profiling organic materials were shown.
Our Managing Director, Ewald Niehuis, gave a review on the recent history and present performance of the various sources available ( Ga, Au, Bi, C60
........) for both organic and inorganic analysis. This was extremely well received, because the development and new uses of the cluster sources has been so rapid that TOF-SIMS analysts have had difficulty keeping up with the latest information. In particular he presented a slide showing the history of sales of the various analytical sources. It clearly shows the preference of the market for the Bismuth source as a first choice. It is early days yet for C60
, but the current technological limitations are keeping the sales low.
For more information, please contact us by e-mail
2005 Worldwide Chinese Secondary Ion Mass Spectrometry & Related Topics Symposium
Jan 24, 2005
Attendees of the Worldwide Chinese Secondary Ion Mass Spectrometry
& Related Topics Symposium. In the group photograph Prof. Benninghoven
can be seen in the middle, flanked by Prof. Ling(left)and Prof. Cha(right).
The Worldwide Chinese Secondary Ion Mass Spectrometry & Related Topics Symposium was successfully held in Hsinchu/Taiwan from the 15th to the 19th of January 2005. About one hundred delegates attended, mainly from Taiwan and mainland China, showing the growing interest in SIMS techniques in the region. Focussing on the characterisation of semiconductor devices, photo-electronic material, nano-scaled materials and bio-materials the symposium provided a welcome opportunity for the exchange of ideas and experience in the field of SIMS.
The plenary lectures were given by by two of the leading academics concerned with the development and application of SIMS over many years, Prof. Benninghoven of the University of Muenster/Germany and Prof. Vandervorst of IMEC/Belgium.
The IONTOF SIMS papers were presented by Dr Derk Rading, our Applications Specialist, who talked about the latest developments in TOF-SIMS, and our local agent Mr H W Wong of HI-TECH Instruments gave a paper in Chinese. Subsequent questions, both at the time of the lectures, and person to person during breaks and mealtimes, showed a strong level of interest in TOF-SIMS by the delegates.
We hope that the organisers will continue with this Symposium and are looking forward to the next Chinese SIMS Symposium.
Do TOF-SIMS users live longer?
Jan 18, 2005
The IONTOF employees have always considered that the use of TOF-SIMS will have a positive influence on your life. Of course, there was no real evidence of a link between the technique and happy living, but the spirit inside the company was always a strong indication.
Last autumn the City of Münster won the international award for Liveable Communities (LivCom). This award is the world’s only Competition for local communities that focuses on environmental management and the creation of liveable communities. The objective of the LivCom award is to encourage best practice, innovation and leadership in providing a vibrant, environmentally sustainable community that improves the quality of life.
Following the award, the city of Münster launched a marketing campaign explaining which criteria had lead to winning the price. One poster of this campaign caught the eyes of the IONTOF team immediately, officially confirming the strong impact of our TOF-SIMS instruments on a positive way of life. It shows a picture through the sample chamber window of our TOF-SIMS instruments. We will follow up this new idea and hope that your instrument might influence your life in a positive way as well. If you do not have your own instrument yet, why don’t you visit our information request site?
Happy and successful New Year 2005!
The IONTOF team
University of Sheffield
Nov 08, 2004
The University of Sheffield, long associated with the city’s traditional metallurgical industry, has been developing rapidly into other material research fields in recent years, and has attracted some high profile research staff.
In particular, recent recruits have included Professor Graham Leggett (Chemistry) and Drs Sally McArthur and Alex Shard (Engineering Materials), all with extensive surface analysis experience. It is therefore not surprising that the University used some of its infrastructure funding to buy a TOF-SIMS, which will be delivered next May, to be installed in a newly refurbished laboratory.
The interests of this group of researchers encompass nanometre scale chemistry, adhesion, surface patterning, tissue engineering and biomaterials, with organic materials (including polymers, plasma polymers and self-assembled monolayers) being a key theme running through all of these areas. This is an area of research for which TOF-SIMS is very well suited, and we are sure they will produce some very interesting developments.
For more information regarding this laboratory, please contact Graham Leggett
or use the enquiry page on this web-site.
Successful Start-up for IONTOF USA Inc.
Oct 05, 2004
The USA market, including both our existing customers and prospective ones, is very important to IONTOF, and we realise that we must have a top class sales and after sales service based in America.
Earlier this year our American subsidiary IONTOF USA Inc was created, to provide a base for our Sales and Service organisation in the USA, and we have been working very hard to build our organisation. This has enabled us to provide the existing customers with a more direct and immediate service support, and to respond more quickly to sales enquiries. Our commitment to the USA market both for sales and service has a high priority, and we look forward to a permanent presence and growing business. We are fortunate that the reliability of our instruments and the competence of our customers make the service load quite light.
We were lucky to employ Richard Holton as our Sales and Office Manager. Richard has a great deal of experience managing dealerships in the instrument market, successful selling and supporting a wide range of instrumentation, and he is not a stranger to TOF-SIMS. This combination of technical and commercial knowledge will provide the type of management required by our USA customers. Richard welcomes your enquiries regarding IONTOF products. His enthusiasm is catching and we are sure you will find him a useful and very helpful person to meet. We wish him every success in his new job. See the Contact page for address details.
The office in Chestnut Ridge is the base for our After Sales Service Department, our Office Administrator and a large stock of spare parts. The stock of spare parts in the USA means we can offer overnight delivery to our users. Our Service Engineers have received full training at our factory in Muenster, Germany, and provide rapid and efficient maintenance of IONTOF instruments.
We are pleased to say that our USA customers are very happy with our new service organisation.
Nano-molecular Analysis for Emerging Technologies
Sep 22, 2004
The National Physical Laboratory(NPL), London, UK is holding a two day conference, 2nd and 3rd November, for those interested in the analysis of complex molecules at surfaces. The first day is devoted to SPM and the second to SIMS, and on both days topics in the vanguard of development and research will be discussed. There is an impressive list of international known invited speakers for both these techniques. The local NPL organisers are themselves established surface analysts, and this will ensure a well structured conference. The registration cost has been kept to a minimum.
Institute of the Chemistry of Natural Substances (ICSN/CNRS) installs a TOF-SIMS for Biomedical Tissue
Sep 21, 2004
The uses of TOF-SIMS for materials surface and interface applications in metallurgy, inorganic and organic chemistry are well known and very successful. The use of TOF-SIMS for bio-medical applications has been pursued by some researchers for many years, but progress has been slow. Many users are successfully analysing bio-materials, the materials used for medical implants, and the polymers involved in the controlled release of medicine into the body, but the break through for analysing tissue has been the introduction of the polyatomic ion source to provide dramatically improved imaging of bio-organic molecules.
A group of researchers at the CNRS site, ICSN (Pr. J.-Y. Lallemand, Director) at Gif sur Yvette, near Paris, saw the potential of these recent source developments and were able to present a very strong case for purchase. Their instrument is now installed and the first results already being published. The Group comes from a MALDI and electrospray mass spectroscopy background and includes Olivier Laprévote , Group Leader, Frédéric Halgand, David Touboul, and Alain Brunelle, who is a Physicist with long experience in ion optics and the desorption phenomena induced by cluster ion impacts on surfaces. They see the TOF-SIMS as the ideal complement to their MALDI instruments.
The group is perfecting a sample preparation technique which requires no staining or marking of the thin tissue sample, since TOF-SIMS has a mass range up to many thousands of Daltons and different molecules can be co-localised direct, without the need to “tag” them and possibly modify them with elemental ions.
Those readers of this who are involved in biochemistry should follow the work of this research group. We look forward to more of their exciting results.
References so far are :
Tissue Molecular Ion Imaging by Gold Cluster Ion Bombardment
D. Touboul, F. Halgand, A. Brunelle, R. Kersting, E. Tallarek, B. Hagenhoff, O. Laprévote,
Anal. Chem. 76 (2004) 1550-1559
Changes of Phospholipid Composition within Dystrophic Muscle by Maldi-TOF-Mass Spectrometry and Mass Spectrometry Imaging
D. Touboul, H. Piednoël, V. Voisin, S. De La Porte, A. Brunelle, F. Halgand and O. Laprévote,
Eur. J. Mass Spectrom, in press
Direct Mapping on Muscle Tissues Slices of Duchenne Myopathy Biomarkers using both MALDI and Cluster-SIMS Imaging Mass Spectrometry
A. Brunelle, D. Touboul, S. De La Porte, E. Tallarek, B. Hagenhoff, F. Halgand, O. Laprévote
Proceedings of the 52nd ASMS Conference on Mass Spectrometry and Allied Topics, Nashville, Tennessee, May 23 - 27, 2004
For more information, please contact IONTOF Sales
or Alain Brunelle
UniS, first to buy a C60 Source
Jul 21, 2004
TOF.SIMS 5 with a custom built UHV connected preparation chamber
The University of Surrey, Guildford, UK have ordered a TOF.SIMS 5 for their UniS Materials Institute. We are delighted that one of our instruments will be installed in this very experienced surface analysis laboratory. The professor in charge is John F Watts, Professor of Materials Science and an adhesion specialist, and one of the senior operators will be Dr Marie-Laure Abel, who holds a Royal Society University Research Fellowship.
The instrument will be the first in the race to be equipped with the recently announced C60 source. We look forward to the UniS team showing us what this source can do for real world analysis. The TOF.SIMS 5 will be also equipped with a gold cluster LMIG and a custom built UHV connected preparation chamber so that surface analysis can be combined with on-line electrochemistry, controlled strain rate and impact fracture, t-peeling test of laminate systems, and a range of deposition techniques.
If you would like more information about the UniS laboratory, please use our enquiry page.
Standards Institutes buy TOF-SIMS IV
Jul 01, 2004
The TOF-SIMS IV is the preferred instrument for standards institutes. The order for a TOF-SIMS IV from PSB Corporation PTE Ltd, Singapore was the fifth from standards organisations in the world, including NIST-National Institute of Standards and Technology(USA), NPL-National Physical Laboratory (UK), SP-Swedish National Testing and Research Institute, and BAM-Bundesanstalt fur Materialforschung (Germany).
This is because standards institutes require the most flexible equipment to be able to produce standards for any instrument function. The wide range of options and accessories, and measurable parameters of the TOF-SIMS IV are attractive to standards scientists. For other TOF-SIMS IV owners it is useful that operating and analytical standards are produced on the same instrument.
4th European Workshop on Secondary Ion Mass Spectrometry
Jun 07, 2004
The 4th European Workshop will be held at the University of Muenster, September 26-29, 2004. As before, emphasis will be put on the analytical applications of SIMS in well-established fields such as microelectronics, but also in particular in emerging fields such as life sciences and nano-technologies. Recognised invited speakers will present keynote lectures, followed by contributed paper and poster sessions.
The workshops on Secondary Ion Mass Spectrometry, held at the University of Muenster in 1998, 2000 and 2002, were attended by approximately 200 participants from many countries, so confirming that such a European workshop, alternating with the biennial International SIMS Conference, meets the needs of both the European and the international SIMS community.
For detailed information please contact: Physics Department of the University of Muenster, Wilhelm-Klemm Str. 10, 48149 Muenster, Germany, Phone: +49 (0)251 83 33611, Fax: +49 (0)251 83 33682, e-mail: email@example.com
We are looking forward to seeing you in Muenster this September!
Bismuth Product Announcement - Key technology for molecular spectroscopy and imaging
May 26, 2004
With the development of the new Bismuth Liquid Metal Ion Source, IONTOF has reached a new level of molecular spectroscopy and imaging performance. The goal was to design a source which is superior to the current Gold Liquid Metal Ion Source in terms of measurement speed, sensitivity for high mass molecular species, image spatial resolution and mass resolution under cluster bombardment.
At the 17th SIMS Workshop IONTOF announced that this goal had been successfully achieved and that the Bismuth source would be commercially available very soon. The new emitter will be available in autumn 2004. The market reaction so far suggests that Bismuth will replace Gold.
16th International Vacuum Congress-Venice
May 17, 2004
For those of you who would like to go to a good Conference and Exhibition in a beautiful city, we suggest you consider IVC16/ ICSS-12/NANO-8/AIV-17 taking place on the Lido di Venezia June 29 to July 01(www.ivc16.infm.it).
ION -TOF will have a stand at the exhibition, where over 50 companies will be represented publicising vacuum and analysis techniques. Sven Kayser and Colin Helliwell will be on the IONTOF stand (No 26 on the first floor). We shall be pleased to see you there to renew old acquaintances and present the latest in TOF-SIMS technology.
First commercial TOF-SIMS in Spain
May 17, 2004
We recently delivered a TOF-SIMS to the University of Vigo in Spain. This is the first commercially designed TOF-SIMS to be installed in Spain, to our knowledge, and we are proud that it is an IONTOF instrument.
The instrument is located in the C.A.C.T.I. institute in the University, in the Surface Analysis Service, which already has XPS, AFM-STM, a nanoindenter and a profilometer. The addition of TOF-SIMS gives them a powerful range of instruments for their work. As in many academic institutions, their planned applications are wide: Semiconductors, Nano technology, Biomaterials, Corrosion studies, and PZT analysis.
Although acting as a Service Centre for the University, CACTI has time available for service and collaboration with academic and commercial analysts outside the University. If you are interested, please contact Carmen Serra Rodriquez, on firstname.lastname@example.org.
Gold, the source of choice at the moment
Sep 05, 2003
As we forecasted in a previous news item our liquid metal Gold ion source has quickly replaced Gallium as the source of choice for analysis of organic materials. The improvement in the imaging of molecular species over Gallium and Indium was evident from the offset. With experience we found that the lateral resolution when using Gold was the same as with Gallium. The technology we use to separate the polyatomic cluster ions and the monoatomic ions from each other in the ion gun works extremely well. Clearly customers have nothing to loose and everything to gain by choosing our Gold source.
Dave Briggs recommends a TOF-SIMS IV
Sep 01, 2003
Many readers will know or have heard of Dave Briggs, past Company Research Associate and Manager of the Surface Analysis Laboratory of ICI at Teeside in the UK, founder and Editor in Chief, until very recently, of the journal Surface and Interface Analysis, and the owner of a Surface Science Consultancy, SIACON Consultants Ltd. In February 2000 he was appointed Professor at the University of Nottingham and asked to initiate a Centre for Surface Chemical Analysis. His joint appointment is with the Schools of Pharmacy, Chemistry and Materials. Key colleagues in this intra-University collaboration are Prof Martyn Davies (Pharmacy), Prof Mike Chesters (Chemistry) and Prof Angela Seddon (Materials). Their first purchase, after extensive investigations by Dave, is a TOF-SIMS IV. Dave particularly liked the dual source (Cs/EI) optical column (with its SF6 ion source possibility), the easy addition of a UHV sample preparation chamber and the sample heating/cooling system. We are sure that this group will produce many interesting analytical results in the years to come.
La Trobe University starting TOF-SIMS Service in Australia
Jun 06, 2003
Associate Professor John Liesegang,
Dr Narelle Brack and Dr Paul Pigram
with the TOF-SIMS IV
The TOF-SIMS IV in the Centre for Materials and Surface Science at La Trobe University in Australia is the only TOF-SIMS in the state of Victoria. The facility is operated by a consortium of La Trobe University, CSIRO Molecular Science, Amcor Research and Technology and Deakin University. Dr Paul Pigram, the Director of the Centre, says that the TOF-SIMS IV will open up a number of expanded research areas, such as micro-patterning polymer systems, surface chemistry of bacteria, surface modification of packaging materials, analysis of lubricant systems on steels, and investigation of the surface properties of biomaterials. Professor Liesegang, project supervisor, sees useful commercial developments, in improved paint systems for the automobile industry, and improvement of sealing and adhesion properties of packaging. The other member of this team, Narelle Brack, is responsible for developing TOF-SIMS applications and customer liaison.
Liquid Metal Gold Cluster Ion Source
Mar 15, 2003
There has been enormous market interest in our new Liquid Metal Gold Cluster Ion Source, announced recently.
It has been understood for some time that heavy polyatomic ions such as SF5 give much improved secondary ion yields for organic species. The new Gold source combines the high secondary ion efficiency of polyatomic bombardment with the high brightness and focus quality known from other LMI sources like Gallium or Indium. It provides a pulsed and mass separated ion beam of Au, Au2 or Au3 for high sensitivity spectroscopy and high resolution imaging. Results with Au3 show up to 100 times higher secondary ion yields than the conventional Gallium source, with comparable ion column performance.
We think that the new source will displace the established 3-lens Gallium source as the first choice primary ion gun for organic surface analysis in the future. Recent new customers involved in wide ranges of sample types confirm our thoughts.
If you want more details and some example of applications, please complete the enquiry form on this web site.
Delivery of TOF-SIMS IV to ICI, UK
Mar 01, 2003
The Measurement Science Group of ICI, one of the biggest companies in the UK, has recently taken delivery of a well equipped TOF-SIMS IV. The 'Surface Science Team' involved at the Teeside laboratories in the North East of England includes Dr Ian Fletcher, Dr Isla Mathieson and Stan F Davies, with many years experience of surface science to help them fully utilise the new instrument.
This is one of the first TOF-SIMS IVs delivered with the new primary ion Gold source, which will give very significant enhancement of the imaging of molecular distributions, an important application for the Group. Actually this is the only instrument so far supplied to be equipped with all the current IONTOF primary ion sources, Au, In, Ga, O2, SF6, and the noble gases. Other applications of importance to them are the analysis of biological samples, analyses involving volatile/mobile species and adhesion studies.
The laboratory is also equipped with a Kratos Axis Ultra XPS instrument making a powerful analytical capability with the TOF-SIMS IV and enabling the Group to offer a full commercial surface analytical service to anyone with surface analysis requirements.
New Premises for IONTOF
Nov 25, 2002
The increasing number of TOF-SIMS IV being sold has meant an increase in the number of staff and the space required, in particular, for Production, R&D and Sales. As those of you who have visited us will have noticed, the building in which we are presently located in not suitable for our expansion, and so for some time now we have been planning a new building, purpose designed for us, to be built close by. This will enable us maintain our scientific links with the University and take advantage of the facilities of the science park where we are at present located. The planning stage is advanced and building will start early next year.
IONTOF takes over its own worldwide marketing from CAMECA
Sep 09, 2002
In the last few days IONTOF users have been informed personally that their future instrument requirements will be handled by IONTOF. The co-operation with Cameca S.A. in Paris, the current marketing agent, will be terminated after a short transition period.
Dr Ewald Niehuis, technical director and co-founder of the company, says:
“IONTOF GmbH has grown rapidly over recent years and is now a mature company with about 50 employees. We have reliable high performance products and over 60 installations worldwide. We have established an after sales service organisation which supports the customers worldwide, and which provides service direct to the European users.
The time is right for us to create our own marketing and selling activity, to have direct contact with the market place, to improve our understanding of the market requirements and to improve our efficiency. We shall carry on offering a high quality of product, reflecting the need of the market as a whole and the requirements of the individual user. We shall carry on developing the products to give improved performance and more applications. We shall continue the series of innovations arising from the co-operation on fundamental research with the University of Muenster and on analytical applications with TASCON GmbH. We have some exciting developments in our future program.
The capability and applications of the TOF-SIMS technique continues to expand and we shall be at the forefront of innovation.”
Successful Year 2001
Jan 08, 2002
In our first full year since separation from our distributor, Cameca, we have established a global sales organisation, published many new sales and technical documents, attended Exhibitions world-wide, and become the largest supplier of high-end TOF-SIMS instruments.
Our sales organisation includes a subsidiary in the USA and agencies in many countries. Customers and potential customers all have access to a local contact address. We are working very closely with our agents to provide a professional commercial service to the market place.
The range of sales and technical documents published includes instrument presentations, application notes, specifications and configuration suggestions, all designed to keep the market informed of the benefits and performance of our TOF-SIMS products. To obtain documents or speak to someone in our organisation, please go to the Contact page.