TOF.SIMS 5

TOF SIMS product: time-of-flight secondary ion mass spectrometry TOF.SIMS 5

Superior Performance for all SIMS Applications

The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications.

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Qtac 100

LEIS product: Quantitative Top Atomic Layer Characterisation with Qtac

Quantitative Top Atomic Layer Characterisation

The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer.

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NanoScan VLS-80

SPM product: high vacuum scanning probe microscope

High-end Vacuum SPM Technology

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.

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Hybrid SIMS

Hybrid SIMS

With the new Q ExactiveTM Extension for its existing product line IONTOF introduces the first commercial SIMS instrument which combines highest mass resolution and highest mass accuracy with high resolution cluster SIMS imaging.

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SIMS / SPM Combination - 3D SIMS imaging

SIMS / SPM Combination

The new TOF.SIMS NCS platform combines all the well-known options of the high-end TOF.SIMS 5 with the possibility to perform in-situ SPM measurements.

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TOF-SIMS surface analysis: fib on cgs time-of-flight secondary ion mass spectrometry

FIB on GCS

Information about the chemical composition in 2D and 3D are of increasing interest. The TOF.SIMS 5 is a powerful tool to provide this kind of information on most sample systems. However, the 3D analysis of extremely rough samples, samples with voids, and samples that exhibit strong local variations in density or sputter yield is almost impossible for conventional SIMS depth profiling.

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IONTOF company: manufacturer of instruments for surface analysis: product time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS)

25 years of Innovation

IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
Founded as a classical spin-off of the University of Muenster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.
The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the technique became commercially viable IONTOF has made many product improvements and more than 280 instruments are in operation in industrial and academic laboratories worldwide.

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News

SurfaceLab 6.8
Jun 12 2018

SurfaceLab 6 version 6.8 build 99022 (bugfixing release 3) has just been released and is ... 
SurfaceLab 6.7
Jun 12 2018

SurfaceLab 6 version 6.7 build 98890 (bugfixing release 5) has just been released and is ... 
Francophone Meeting
Mar 28 2018
In the framework of its activities in the field of material analysis, the Luxembourg Institute of ... 
Open Position
Mar 13 2018
The Renewable Energy Materials Research Science and Engineering Center (REMRSEC) is seeking a ... 

Upcoming Events

SIMS & ASSD
Jun 2018
SIMS USA 2018 will be a one-day meeting at PNNL focused on all aspects of secondary ion mass ... 
HRDP-9
Jun 2018
The 9th international workshop on High-Resolution Depth Profiling (HRDP-9) will be held ... 
SISS-20
Jun 2018
The SISS-20 will be held at Seikei University in Tokyo. The meeting will cover SIMS and related ... 
ALD 2018
Jul 2018
The AVS 18th International Conference on Atomic Layer Deposition (ALD 2018) featuring ...