TOF.SIMS 5

TOF SIMS product: time-of-flight secondary ion mass spectrometry TOF.SIMS 5

Superior Performance for all SIMS Applications

The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications.

Read more ...

Qtac 100

LEIS product: Quantitative Top Atomic Layer Characterisation with Qtac

Quantitative Top Atomic Layer Characterisation

The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer.

Read more ...

NanoScan VLS-80

SPM product: high vacuum scanning probe microscope

High-end Vacuum SPM Technology

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.

Read more ...
Hybrid SIMS

Hybrid SIMS

With the new Q ExactiveTM Extension for its existing product line IONTOF introduces the first commercial SIMS instrument which combines highest mass resolution and highest mass accuracy with high resolution cluster SIMS imaging.

Read more ...
SIMS / SPM Combination - 3D SIMS imaging

SIMS / SPM Combination

The new TOF.SIMS NCS platform combines all the well-known options of the high-end TOF.SIMS 5 with the possibility to perform in-situ SPM measurements.

Read more ...
TOF-SIMS surface analysis: fib on cgs time-of-flight secondary ion mass spectrometry

FIB on GCS

Information about the chemical composition in 2D and 3D are of increasing interest. The TOF.SIMS 5 is a powerful tool to provide this kind of information on most sample systems. However, the 3D analysis of extremely rough samples, samples with voids, and samples that exhibit strong local variations in density or sputter yield is almost impossible for conventional SIMS depth profiling.

Read more ...
IONTOF company: manufacturer of instruments for surface analysis: product time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS)

25 years of Innovation

IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
Founded as a classical spin-off of the University of Muenster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.
The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the technique became commercially viable IONTOF has made many product improvements and more than 280 instruments are in operation in industrial and academic laboratories worldwide.

Read more ...
 

News

LEIS on YouTube
May 13 2019
Thomas Grehl and Nathan Havercroft took the time to produce a series of short videos about low ... 
Postdoc at UFZ
Jan 07 2019
The Department of Isotope Biogeochemistry led by PD Dr. Hans Richnow, invites applications for a ... 
Season's Greetings
Dec 19 2018
We wish you a prosperous, successful New Year and would like to thank you for your co-operation and ... 
Position at BAM
Dec 18 2018
The Federal Institute for Materials Research and Testing (BAM) is looking for a new scientific ... 

Upcoming Events

JEMS 2019
Aug 2019
The Joint European Magnetic Symposia (JEMS) combine to form the most important and comprehensive ... 
ECASIA'19
Sep 2019
The 18th ECASIA will be held from 15th to 20th September 2019 in ... 
IBA 2019
Oct 2019
The IBA (Ion Beam Analysis) conference deals with the science, development, techniques and ... 
SIMS 22
Oct 2019
The 22nd International Conference on Secondary Ion Mass Spectrometry will be held in the ...