TOF.SIMS 5

TOF SIMS product: time-of-flight secondary ion mass spectrometry TOF.SIMS 5

Superior Performance for all SIMS Applications

The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications.

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Qtac 100

LEIS product: Quantitative Top Atomic Layer Characterisation with Qtac

Quantitative Top Atomic Layer Characterisation

The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer.

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NanoScan VLS-80

SPM product: high vacuum scanning probe microscope

High-end Vacuum SPM Technology

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.

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IONTOF company: manufacturer of instruments for surface analysis: product time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS)

25 years of Innovation

IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
Founded as a classical spin-off of the University of Muenster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.
The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the technique became commercially viable IONTOF has made many product improvements and more than 280 instruments are in operation in industrial and academic laboratories worldwide.

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TOF-SIMS surface analysis: fib on cgs time-of-flight secondary ion mass spectrometry

FIB on GCS

Information about the chemical composition in 2D and 3D are of increasing interest. The TOF.SIMS 5 is a powerful tool to provide this kind of information on most sample systems. However, the 3D analysis of extremely rough samples, samples with voids, and samples that exhibit strong local variations in density or sputter yield is almost impossible for conventional SIMS depth profiling.

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News

Sales Manager (f/m)
Sep 28 2016
IONTOF is looking for a new Regional Sales Manager (f/m) for our international sales team. As a ... 
Chinese User School
Sep 06 2016
Last month, the first IONTOF Chinese User School took place in Shanghai. The East China University ... 
SurfaceLab 6.6
Jul 04 2016

SurfaceLab 6 version 6.6 build 82838 (bugfixing release 2) has just been released and is ... 
NPL Launch Event
Jun 27 2016
The National Centre of Excellence in Mass Spectrometry Imaging (NiCE-MSI) is hosting a one-day ... 

Upcoming Events

PSA-16
Oct 2016
The 7th International Symposium on Practical Surface Analysis (PSA-16) will be held in Daedeok ... 
AVS 63rd
Nov 2016
The AVS International Symposium and Exhibition has been developed to address cutting-edge issues ... 
PacSurf 2016
Dec 2016
This conference is being organized by AVS (United States) with a Steering Committee composed of ... 
SAOG Meeting
Jan 2017

The SAOG Meeting is an annual, one day symposium covering newest developments in the field of ...