The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications.

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The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer.

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The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.

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With the new Q Exactive^TM Extension for its existing product line IONTOF introduces the first commercial SIMS instrument which combines highest mass resolution and highest mass accuracy with high resolution cluster SIMS imaging.

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The new TOF.SIMS NCS platform combines all the well-known options of the high-end TOF.SIMS 5 with the possibility to perform in-situ SPM measurements.

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Information about the chemical composition in 2D and 3D are of increasing interest. The TOF.SIMS 5 is a powerful tool to provide this kind of information on most sample systems. However, the 3D analysis of extremely rough samples, samples with voids, and samples that exhibit strong local variations in density or sputter yield is almost impossible for conventional SIMS depth profiling.

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The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the technique became commercially viable IONTOF has made many product improvements and more than 280 instruments are in operation in industrial and academic laboratories worldwide.

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