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Products
M6
M6 Plus
M6 Hybrid SIMS
TOF.SIMS 5
Qtac
VLS-80
SurfaceLab 7
TOF-SIMS & LEIS Technique
Applications
Semiconductor
Polymer
Paints and Coatings
Biomaterials
Pharmaceuticals
Glass
Paper
Metals
Catalysts
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Products
SIMS Instrumentation
M6
The latest, multi-purpose instrument guaranteeing superior performance in all application areas.
M6 Plus
The M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.
M6 Hybrid SIMS
High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application.
TOF.SIMS 5
Field proven and efficient TOF-SIMS tool which outperforms most of its external rivals.
Low Energy Ion Scattering
Qtac
Extremely surface sensitive instrument, providing unique and quantitative characterisation of the top atomic layer.
Scanning Probe Microscopy
VLS-80
High vacuum scanning probe microscope developed by NanoScan in Switzerland.
Software
SurfaceLab 7
Versatile instrument operation, data acquisition and data analysis software package for all IONTOF instruments.
How it works
TOF-SIMS and LEIS
Learn more about how advanced surface analysis works.
Applications
Applications
Semiconductor
The detection and quantification of trace metals is an important analytical task in the semiconductor industry.
Polymer
Discolourations on polymers are often caused by phase separation of the material's components.
Paints and Coatings
Coatings are of increasing importance for many industrial products for reasons of decoration as well as stability.
Biomaterials
The ability to image molecular compounds with high special resolution is very useful for biological applications.
Pharmaceuticals
SIMS can be used to determine the distribution of the different ingredients within pharmaceutical products.
Glass
TOF-SIMS is a very powerful technique for the analysis of non-conductive materials e.g. glass.
Paper
Paper surfaces are treated to obtain special surface properties. These modifications can be investigated.
Metals
One major advantage of TOF-SIMS is the opportunity to combine high lateral and high depth resolution.
Catalysts
For catalysis the characterisation of the top atomic layer is essential. LEIS is the ideal technique for this application.
About IONTOF
About IONTOF
IONTOF Group
Today, the IONTOF group consists of four different companies located in Germany, the USA and Switzerland.
News
Stay in touch with IONTOF and learn more about the latest development around our products and applications.
Events
IONTOF participates in many different conferences, workshops and other events all over the world.
Data & Facts
IONTOF's success is based on the longstanding experience in the field and the skills of our scientists and engineers.
Career Forum
If you are interested in a new challenge in an innovative working environment, IONTOF might be the place for you.
Vision
One can only be successful if deep understanding of the challenges can be combined with longstanding experience.
Policies
IONTOF is not only committed to developing products that are safe and environmentally sound.
History
Since 1989, the contribution of IONTOF to the development of the TOF-SIMS technique has been unceasing.
Support
Support
Service
When help is needed there is no time to waste.
The IONTOF service team is available 24/7.
Sales
The IONTOF sales team supports potential customers to find the best solution for their demands.
Find brochures and application notes here.
Download Area
The IONTOF download area for access to the SurfaceLab software updates, helpfiles and release notes.
Information Request
For information about our products and services, please complete the information request form.
Customer Feedback
Help us to get even better and send us your suggestions or report any problems you experienced.
Analytical Service
For analytical service IONTOF works in a close cooperation with Tascon, specialised in analytical service.
The all new M6
Advanced Ion Beam Technology for Surface Analysis
M6 - SIMS technology one step ahead
The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.
Read more…
Ground-breaking new developments for the M6
New TOF Analyser
The revolutionary new design of the extraction optics, the ion transfer and detection system provides a new level of mass resolution, mass accuracy and transmission. This new level of performance allows mass interferences of e.g. CH/
13
C, CH
2
/N containing molecules to be resolved even in the higher mass range, thus facilitating molecular peak identification.
In combination with high repetition rates and the improved primary ion currents of the Nanoprobe 50, three times lower detection limits can be achieved in dual beam depth profiling.
The new design has also been optimised for the measurements in the so-called delayed extraction mode making it the first TOF-SIMS instrument on the market to combine high resolution imaging with spot sizes below 50 nm with high mass resolution spectrometry.
Read more…
Nanoprobe 50
The Nanoprobe 50 is the latest generation bismuth cluster ion source for the M6. The source provides pulsed primary ion currents of up to 40 pA and an ultimate lateral resolution of well below 50 nm. The new bipolar bunching system can operate at repetition rates of up to 50 kHz, allowing for extremely high data rates and improved detection limits. The Nanoprobe 50 is the ideal primary ion source for high lateral resolution microanalysis and imaging as well as high mass resolution surface spectrometry and depth profiling.
1
50 nm lateral resolution guaranteed
2
New bipolar bunching system for improved spectrometry performance and ease of operation
3
In-column measurement of mass separated, pulsed primary ion currents
Read more…
TOF MS/MS
The interpretation of organic TOF-SIMS spectra can be quite challenging and requires a reasonably experienced user. To facilitate data interpretation IONTOF provides different tools such as spectra libraries, advanced software package and the ultimate performance Q Exactive
TM
extension for the M6. With the new ToF MS/MS option IONTOF now also offers a more cost effective MS/MS solution for the M6. The option is ideally suited for quick confirmation of anticipated contaminants or compositions and fast MS/MS imaging or depth profiling applications. Key features of the new TOF MS/MS are:
1
High transmission (> 80%) and sensitivity
2
High mass resolution precursor selection to avoid MS2 fragmentation pattern interferences
3
Sequential, full MS1 and MS2 data streams with individually optimised analysis conditions
Read more…
The M6 Plus
Combining SIMS and SPM in situ
M6 Plus - The tool for nano characterisation
Information concerning chemical composition, physical properties and the three-dimensional structure of materials and devices at the nanometre scale is of major importance for new developments in nanoscience and nanotechnology. The new M6 Plus platform combines the high-end performance of the M6 with the possibility to perform in situ SPM measurements making it the ideal tool for high-end nano characterisation.
Read more…
The M6 Hybrid SIMS
Hybrid SIMS - Surface analysis meets organic mass spectrometry
With the Q Exactive
TM
extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging. The powerful combination of the gas cluster ion source and the Orbitrap
TM
analyser enables the distinction of different features even in highly complex organic samples.
Read more…
TOF.SIMS 5
The most sold TOF-SIMS
instrument world wide
TOF.SIMS 5 - Field proven and efficient
With the TOF.SIMS 5 IONTOF offers a field proven and efficient TOF-SIMS tool which still outperforms most of its external rivals. The current design guarantees good performance in all fields of SIMS applications, making it an extremely attractive SIMS tool for customers in industry and academia.
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The Qtac
High performance low energy ion scattering (LEIS)
Quantitative top atomic layer characterisation
With the Qtac IONTOF offers a high sensitivity Low Energy Ion Scattering (LEIS) instrument. The extreme surface sensitivity of LEIS makes the Qtac the perfect instrument to study surface processes in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, and fuel cells.
Read more…
