The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland.
The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation.
The new SPM scanner provides a scan range of 80 x 80 µm2 with 20 bit scanner resolution and allows for SPM analysis down from the nanometer up to the millimeter range.
High resolution photo navigation in combination with the new high precision sample stage provides unique possibilities for sample navigation.
The instrument can be operated under normal atmosphere condition or in high vacuum for maximum sensitivity in all dynamic SPM modes.
The NanoScan controller system supports all standard SPM modes and also supports unique features such as tip protection and long-distance surface profiling.