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Sample Navigation

The design of the instrument is such that the sample is always at ground potential and in a horizontal orientation. All components such as ion guns, analyser, secondary electron detector, electron flood gun and video cameras are aligned to the joint point of analysis. This allows permanent control of the analysed area and excellent sample navigation.
Rapid location of the area of interest on the sample can be made by using the two TV cameras. In addition, higher resolution total ion or electron images of the sample for area location and topographical information can be acquired.
If necessary, the sample holder may be scanned prior to analysis on a high resolution computer scanner, and the digital image can be transmitted to the TOF.SIMS 5 navigation software.
Sample Navigation: SurfaceLab navigator tool Screenshot
 
Screenshot of the SurfaceLab navigator tool

TOF.SIMS 5 Details

Features

TOF Analyser
SurfaceLab Software
Sample Navigation
Vacuum System
Sample Stage
Charge Compensation

Configurations

Hybrid SIMS
SPM Combination
Customised Configurations
Instrument Coupling
Cleanroom Adaptation

Options

Bi Nanoprobe
Gas Cluster Source
Dual Source Column (O2 and Cs)
EDR Analysis
Fast Sample Rotation
Sample Heating and Cooling
Transfer Vessel
Special Sample Holders
Glove Box
FIB on GCS



Download

 TOF.SIMS 5 Brochure.pdf

 Hybrid-SIMS.pdf
 SIMS-SPM-Combination.pdf
 FIB-on-GCS.pdf
 EDR-Analysis.pdf
 Fast-Sample-Rotation.pdf
 Gas-Cluster-Source.pdf
 Spherical-Lenses.pdf
 Peak-Identification.pdf
 3D-Analysis.pdf
 Bi-Nanoprobe.pdf
 Depth-Profiling.pdf
 Cells-and-Tissues.pdf
 Heating-and-Cooling.pdf
 Large-Area-Mapping.pdf
 Patented-Burst-Mode.pdf
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TOF.SIMS 5
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Features
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Options
Technique
VLS-80
Applications
Semiconductors
Polymers
Coatings
Biomaterials
Pharmaceuticals
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Paper
Metals
Catalysts
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Upgrades
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IONTOF GmbH
Heisenbergstraße 15
48149 Münster

+49 (0)251 1622-100
+49 (0)251 1622-199
sales@iontof.com








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