The characterisation of organic layer systems is of increasingly high technological and commercial interest. The use of large argon clusters as sputter species in Time-of-Flight SIMS experiments allows the depth profiling of most organic materials to be carried out whilst retaining the intact molecular information during the profile. This makes the gas cluster ion source a powerful tool in the field of organic SIMS analysis.
The preservation of molecular information under high-dose sputtering conditions is not only a pre-requisite for depth profiling and 3D analysis of organic materials, but it also boosts the amount of sample material available beyond the static SIMS limit in high-resolution imaging. With the fully integrated gas cluster ion source IONTOF provides a comprehensive solution for many organic SIMS applications.
fully integrated solution
optimised for dual and single beam depth profiling
energy range of up to 20 keV
spectroscopy mode available
Organic Depth Profile of an OLED Layer System
The example shows a SIMS depth profile through the organic layer structure of an OLED device displaying the signal intensities of the different intact molecules.
Gas Cluster Spectrometry
Large argon cluster ions can also very successfully be applied as primary ion projectiles in TOF-SIMS.The unique IONTOF 90° pulsing system of the gas cluster source enables the generation of short primary ion pulses for high mass resolution surface spectrometry and allows the variation of the applied cluster sizes from 250 to 10000 atoms/cluster.
This opens up the possibility to study the effects of using primary ion beams with an energy of down to 2 eV per cluster atom in detail and investigate the influence of the cluster size on the spectra appearance, the fragmentation and the secondary ion yield.
The example shows an analysis of a polycarbonate sample using large argon cluster as primary ions with a beam energy of 20 keV. The selected cluster size was around 7500 argon atoms per cluster which corresponds to an average ion energy of 2.6 eV/atom. The spectrum mainly shows the signals of the four most characteristic peaks of polycarbonate.
Spectra of polycarbonat using large argon clusters as primary projectiles