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SIMS  Time-of-Flight  Surface Spectroscopy  Surface Imaging  Depth Profiling  3D Analysis  Retrospective Analysis LEIS Retrospective Analysis As well as comprehensive on-line analysis, the parallel mass detection of the TOF.SIMS 5 and the TOF.SIMS 300 provides the means to carry out Retrospective Analysis. Regardless of the knowledge about the sample before the measurement, the data can be explored afterwards to look for unexpected results, such as unknown structures, contaminants at interfaces and so on. The x, y, z coordinates and mass of every secondary ion reaching the detector are stored. The software can reconstruct spectra from any coordinate or group of coordinates, images from any section, vertical or horizontal, depth profiles from any selected area and various 3D views as required.