2009 2008200720062005200420032002
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06.04.2009
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ION-TOF acquires majority of NanoScan shares
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We are pleased to announce that ION-TOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.
NanoScan Ltd. is a spin-off company of the University of Basel. The company was set up in 2003, when the initiators at the Institute of Physics developed a prototype of their high-resolution Magnetic Force Microscope capable of enhancing the resolution by a factor of ten compared to other available microscopes.
Today, NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).
After the acquisition NanoScan will remain an independent company in Switzerland. Dr. Raphaëlle Dianoux has been appointed CEO and will lead the company together with Dr. Guido Tarrach as CTO. Both scientists have long-term experience in the development and the application of scanning probe microscopy.
This acquisition will grant ION-TOF access to new technologies in the field of nanoscience, thus strengthening our position as a leading manufacturer of instrumentation for surface analysis. We are certain that our future product lines will benefit from these new technologies.
NanoScan: High Resolution Magnetic Force Microscope (hr-MFM)
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27.05.2009
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Fully refurbished ION-TOF instruments for sale
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We are pleased to announce that we have some used instruments for sale at the moment. There are older
TOF-SIMS IV type instruments available as well as instruments of the current type TOF.SIMS 5. The latter have previously been used as demonstration or R & D equipment.
Prices start from 200,000.00 EUR, depending on the configuration and on upgrades you may wish to purchase.
All instruments are in a very good condition and have undergone thorough functionality tests at ION-TOF GmbH.
If you would like additional information or if you are interested in obtaining a quotation for any of the above-mentioned instruments please contact sales@iontof.com.
TOF-SIMS IV
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06.08.2009
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SIMS XVII
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SIMS XVII in Toronto, Canada is fast approaching. At the conference, we will have an exhibition booth where you will be able to obtain the latest information on our products. We will also contribute to the conference by giving various talks which we trust will be of great interest for the SIMS community.
Together with ION-TOF USA we will host a users reception on Monday, 14th September 2009. A buffet style dinner will be provided and we have chosen a special location for this event - let us surprise you! We look forward to entertaining our customers and associates. If you have not yet registered for this event but would like to join us, please send an email to sales@iontof.com.
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30.09.2009
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First Qtac installation
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ION-TOF GmbH is pleased to announce the successful installation of its first Qtac instrument in the Department of Catalysis and Materials at the University of Lille in France. After a smooth and punctual acceptance, the system has now begun routine operation and will support the users in gaining valuable information about their samples, which include materials such as catalysts, metals and polymers.
The Qtac, which is able to measure the properties of the first monolayer of the sample, has been supplied in combination with a TOF.SIMS 5 and an Axis Ultra XPS from Kratos Analytical Ltd. The complementary analysis capabilities of these instruments provide the University of Lille with a very powerful surface analysis system.
We wish the University of Lille every success in their research endeavours using the new system!
LEIS, TOF-SIMS, XPS combination instrument at the University of Lille
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