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14.03.2013
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French Users Meeting
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We are pleased to announce the third francophone TOF-SIMS Users Meeting, which will take place in Ecully (close to Lyon) in the building of the Ecole Centrale de Lyon (ECL) on 28th March 2013. This year the meeting is organised by Alain Brunelle, Pascale Richardin, Anouk Galtayries, Colin Helliwell and Brigitte Georges. We will have many interesting presentations on different application areas and we are glad to present the program for the annual users meeting:
10:00 Café, prise de badge
10:30
Accueil (Ecole Centrale Science et Surfaces)
10:35
Introduction de la journée (organisation permanente)
10:45
Derk Rading, Muenster (Allemagne) Conférencier ION-TOF: High sensitivity and high dynamic
range TOF-SIMS depth profiles using the EDR technology
11:30
Arnaud Delcorte, PCPM Louvain-La-Neuve (Belgique) Conférencier invité SFSM: Impacts
d'agrégats massifs: Désorption, fragmentation, ionisation
12:15
Delphine Pavon (Science et Surfaces): Apport de la technique ToF-SIMS pour des applications dans les domaines du biomédial et du textile
12:30
Déjeuner, avec les compliments d’ION-TOF
13:30
Visite de Sciences et Surfaces
14:00
Giacomo Ceccone, DG JRC, Ispra (Italie) Conférencier invité SFV: Caractérisation de
surface de nanomatériaux pour des applications biologiques
14:45
Arnaud Mazenc (LPCS, Chimie ParisTech): Caractérisation chimique par ToF-SIMS de surfaces d'alliages base nickel oxydés en milieu primaire
15:05
Marc Veillerot (CEA/LETI): Amélioration de la méthodologie d'analyse par ToF-SIMS des résidus de VPD pour la détermination des traces de contamination métallique sur les surfaces silicium
15:25
Manale Noun (LAEC (Beyrouth) +IPNO (Orsay)): Analyse de la météorite PARIS grâce aux faisceaux d'agrégats de bismuth et d'argon
15:45
Vincent Thoreton (UCCS, Lille): Utilisation du SIMS pour la caractérisation du transport de l'oxygène dans des matériaux de cathode de piles à combustible haute-température
(SOFC)
16:05
(Biophy Research et Orsay Physics ): Source plasma FIB fort courant : Applications et complémentarité avec l'imagerie Tof SIMS
16:25
Roland Benoit (Univ. Orléans) Site web ToF-SIMS : le point
16:35
Discussion ouverte : date et lieu de la réunion 2014.
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17.01.2013
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SIMS XVIII papers
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The Wiley Online Library has published all papers from the 18th International Conference on Secondary Ion Mass Spectrometry. They can currently be downloaded free-of-charge from this website:
SIMS XVIII papers.
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22.11.2012
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TOF-SIMS investigates Sunscreen safety
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As we reach for our winter clothes few of us are thinking of the beach but the next time we apply our sunscreen think of Professor Nancy Monteiro-Riviere's research studies on the interaction between sunscreen and skin. Along with colleagues at NC State and BASF she has investigated the penetration depth of TiO2 and ZnO nanoparticles in skin.
By using SEM, TEM and TOF-SIMS (ION-TOF TOF.SIMS 5 located in the Analytical Instrumentation Facility at NC State) the researchers were able to determine that penetration of ZnO and TiO2 nanoparticles was slightly enhanced in UVB-sunburned skin compared to non-damaged skin.
A synopsis of the work and interview with Prof. Monteiro-Riviere can be read in Volume 89, Issue 32 page 44-46 of C&E News, also available online.
The full article was published in Toxicological Sciences
(Toxicol. Sci., DOI:
10.1093/toxsci/kfr148).
Prof. Monteiro-Riviere has since moved to the College of Veterinary Medicine at Kansas State University where she also is Director of the Nanotechnology Innovation Center for Kansas State.
We wish her good luck in her new position and look forward to more TOF-SIMS studies from her group!
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