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Exhibitions and Meetings 2010
18 - 22 January
11th Joint MMM-Intermag Conference, Washington D.C., USA.
Representatives from NanoScan Ltd. will attend this event. Meet them at booth #12.
webpage: MMM-Intermag
22 January
Swiss User Group Surfaces and Interfaces -
26th Annual Meeting, Université de Fribourg, Switzerland.
Sven Kayser will attend this meeting.
webpage: SAOG 2010
4 March
9. Treffen der GMM-Fachgruppe "Prozesskontrolle, Inspektion & Analytik", Erlangen, Germany.
Sven Kayser will attend this meeting and give a talk on "Ultra-thin film characterisation using Low Energy Ion Scattering (LEIS)".
webpage: GMM-Fachgruppe
7 - 10 March
Surface Analysis 2010, Orlando, Florida, USA.
Our colleagues from ION-TOF USA, Inc. will attend this event.
webpage: Surface Analysis 2010
11 - 15 April
Novel Application of Surfaces and Materials, Manchester, UK.
Colin Helliwell will attend the exhibition held during this event. The exhibition will take place on 13th and 14th April.
webpage: NASM3
16 - 21 May
22nd Annual SIMS Workshop, Norfolk, VA, USA.
Representatives from ION-TOF will attend this workshop. Dr. Derk Rading will give an invited talk about organic depth profiling.
webpage: SIMS Workshop
28 - 31 May
33rd Annual Meeting of the Sociedade Brasileira de Química, Aguas de Lindoia, Brazil.
Professor Hidde H. Brongersma will attend this meeting and give a talk on "High Sensitivity LEIS: A New Tool in the understanding of Surface and Interface Processes".
10 - 11 June
SISS 12 - The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University, Tokyo, Japan.
Dr. Markus Terhorst will attend this event together with our local distributor, Hitachi High-Tech Trading Corp.
webpage: SISS-12
20 - 23 June
ALD 2010 - 10th International Conference on Atomic Layer Deposition, Seoul, South Korea.
Professor Hidde H. Brongersma will attend this conference.
webpage: ALD 2010
1 - 5 August
M&M 2010, Portland, OR, USA.
Dr. Thomas Grehl and Dr. Felix Kollmer
will attend this event together with Dr. Nathan Havercroft from ION-TOF USA, Inc.
8 - 13 August
21st International Conference on the Application of Accelerators in Research and Industry (CAARI 2010), Fort Worth, TX, USA.
Representatives from ION-TOF will attend this event. We will also give a talk.
webpage: CAARI 2010
23 - 27 August
18th International Vacuum Congress (IVC-18), Beijing, China.
This conference will be held in combination with the International Conference on Nanoscience and Technology (ICN+T 2010), the 14th International Conference on Surface Science (ICSS-14) and the Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA-5). Sven Kayser will attend with our local representative from China, GermanTech Co. Ltd.
webpage: IVC-18
29 August - 3 September
ECOSS-27 European Conference on Surface Science, Groningen, The Netherlands.
We will attend this event and look forward to seeing you at the ION-TOF booth (no. 10).
webpage: ECOSS-27
19 - 21 September
SIMS Europe 2010, Muenster, Germany.
This is a very important event for us in 2010 and we look forward to contributing. As it has become traditional, we will invite our customers to attend an ION-TOF Users Meeting immediately following this event. We sent out a corresponding circular in June and are available for any questions on sales@iontof.com.
webpage: SIMS Europe 2010
26 - 30 September
4th World Congress on Adhesion and Related Phenomena, WCARP-IV, Arcachon, France.
Colin Helliwell will attend this event. Please visit us at
booth # 1.
webpage: WCARP-IV
27 - 29 September
16. Arbeitstagung Angewandte Oberflächenanalytik -
AOFA 16, Kaiserslautern, Germany.
We will attend this meeting with an exhibition stand.
webpage: AOFA 16
3 - 6 October
PSA-10 - 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan Symposium on Surface Analysis, Gyeongju, South Korea.
Dr. Markus Terhorst and Dr. Derk Rading will attend this event together with ION-TOF's local representative, SSK Surface Systems Korea.
webpage: PSA-10
17 - 22 October
16. American Vacuum Society, AVS 57th International Symposium and Exhibition, Albuquerque, NM, USA.
ION-TOF will attend this event.
webpage: AVS
24 November
Inaugural TOF-SIMS LEIS Workshop, Imperial College, London, UK.
Professor Hidde H. Brongersma will attend this workshop and give a talk on "Analysis and LEIS quantification".
webpage: Inaugural TOF-SIMS LEIS Workshop
This website is frequently updated. Please visit again for new information!
last update: 22.07.2010
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