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Exhibitions and Meetings 2008
25 January
Swiss User Group Surfaces and Interfaces - 24th Annual Meeting, Université de Fribourg, Switzerland.
Sven Kayser will be there with our exhibition stand and present a poster on "Top atomic layer characterisation by low energy ion scattering (LEIS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS): A comparison of two complementary techniques".
webpage:
SAOG 2008
3 - 5 March
NCCC - IXth Netherlands'Catalysis and Chemistry Conference, Noordwijkerhout, The Netherlands.
We will have an exhibition stand at this event. Dr Thomas Grehl will give a talk on "New possibilities in high sensitivity Low Energy Ion Scattering (LEIS) for probing the outermost atomic layer".
webpage: NCCC
30 March - 2 April
First International Conference on Functional Nanocoatings, Budapest, Hungary.
We are attending this conference, which will be hosted by the Chemical Research Center of the Hungarian Academy of Sciences in Budapest. This event is devoted to creating an environment where engineers and scientists can exchange ideas regarding the manufacture and functionality of nanocoatings, and of course measurement with techniques such as TOF-SIMS and LEIS have a role to play. We shall have a stand in the trade exhibition and we shall present an oral paper on the use of the TOF.SIMS 5 and the Qtac 100.
webpage: Functional Nanocoatings
11 - 16 May
21st Annual Workshop on SIMS, San Antonio, Texas, USA.
We will attend this workshop together with representatives from ION-TOF USA, Inc.
webpage: SIMS Workshop
29 June - 2 July
8th International Conference on Atomic Layer Deposition (ALD 2008), Bruges, Belgium.
We will be present at this event.
webpage: ALD 2008
17 - 18 July
10th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-10), Tokyo, Japan.
Dr Markus Terhorst and Dr Derk Rading will attend this symposium. Dr Terhorst will give a presentation on "Recent developments in Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and Low Energy Ion Scattering (LEIS)". Dr Rading will give a talk on "Depth Profiling of organic materials using TOF-SIMS under improved ion beam conditions".
webpage: SISS-10
8 - 10 September
15. Arbeitstagung Angewandte Oberflächenanalytik AOFA 15, Soest, Germany.
We will attend this event with an exhibition stand.
webpage: AOFA 15
14 - 16 September
SIMS Europe 2008 - 6th European Workshop on Secondary Ion Mass Spectrometry, Muenster, Germany.
Mark your calenders for this important event. We will keep you informed about ION-TOF's participation in SIMS Europe 2008 on this website.
webpage: SIMS Europe 2008
Directly following SIMS Europe 2008, we will again hold an ION-TOF Users Meeting. As it has become traditional, we will invite our users for a dinner event on the evening of the Tuesday (16 September). The proceedings will take place on Wednesday 17 September.
Customers who wish to attend the Users Meeting but have not received a registration form are welcome to contact our sales department.
19 - 24 October
AVS 55th International Symposium and Exhibition, Boston, USA.
We will attend this event together with representatives from ION-TOF USA, Inc.
webpage: 55th AVS Int. Symposium and Exhibition
last update: 01.07.2008
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