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Exhibitions and Meetings 2010
18 - 22 January
11th Joint MMM-Intermag Conference, Washington D.C., USA.
Representatives from NanoScan Ltd. will attend this event. Meet them at booth #12.
webpage: MMM-Intermag
22 January
Swiss User Group Surfaces and Interfaces - 26th Annual Meeting, Université de Fribourg, Switzerland.
Sven Kayser will attend this meeting.
webpage: SAOG 2010
4 March
9. Treffen der GMM-Fachgruppe "Prozesskontrolle, Inspektion & Analytik", Erlangen, Germany.
Sven Kayser will attend this meeting and give a talk on "Ultra-thin film characterisation using Low Energy Ion Scattering (LEIS)".
webpage: GMM-Fachgruppe
7 - 10 March
Surface Analysis 2010, Orlando, Florida, USA.
Our colleagues from ION-TOF USA, Inc. will attend this event.
webpage: Surface Analysis 2010
11 - 15 April
Novel Application of Surfaces and Materials, Manchester, UK.
Colin Helliwell will attend the exhibition held during this event. The exhibition will take place on 13th and 14th April.
webpage: NASM3
16 - 21 May
22nd Annual SIMS Workshop, Norfolk, VA, USA.
Representatives from ION-TOF will attend this workshop.
webpage: SIMS Workshop
28 - 31 May
33rd Annual Meeting of the Sociedade Brasileira de Química, Aguas de Lindoia, Brazil.
Professor Hidde H. Brongersma will attend this meeting and give a talk on "High Sensitivity LEIS: A New Tool in the understanding of Surface and Interface Processes".
1 - 5 August
M&M 2010, Portland, OR, USA.
ION-TOF USA, Inc. will attend this event.
8 - 13 August
21st International Conference on the Application of Accelerators in Research and Industry (CAARI 2010), Fort Worth, TX, USA.
Representatives from ION-TOF will attend this event. We will also give a talk.
webpage: CAARI 2010
19 - 21 September
SIMS Europe 2010, Muenster, Germany.
This is a very important event for us in 2010 and we look forward to contributing. As it has become traditional, we will invite our customers to attend an ION-TOF Users Meeting immediately following this event. We will keep you informed!
27 - 29 September
16. Arbeitstagung Angewandte Oberflächenanalytik -
AOFA 16, Kaiserslautern, Germany.
We will attend this meeting with an exhibition stand.
webpage: AOFA 16
17 - 22 October
16. American Vacuum Society, AVS 57th International Symposium and Exhibition, Albuquerque, NM, USA.
ION-TOF will attend this event.
webpage: AVS
This website is frequently updated. Please visit again for new information!
last update: 16.02.2010
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