GIF87aмFчџџџRВНаJdŽ0ekЄиоч,IzžКџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџ,мFў(XР ƒ"H˜@Ё‚… 2hиРЁƒ‡ BˆAЂ„‰(RЈXСЂ…‹0bؘAЃ†8rшиСЃ‡@‚BЄˆ‘#H’(YТЄ‰“'PЂH™BЅŠ•+XВhйТЅ‹—/`ТˆCІŒ™3hвЈYУІ›7pтШ™CЇŽ;xђшйУЇŸ?€ DЈЁCˆ)ZФЈ‘ЃG"IšDЉ’ЅK˜2iкФЉ“ЇO B‰EЊ”ЉSЈRЉZХЊ•ЋWАbЩšEЋ–­[ИrщкХЋ—Џ_Р‚ FЌ˜БcШ’)[ЦЌ™ГgаЂI›F­šЕkиВiлЦ­›ЗoрТ‰G€їярУў‹OОМљѓшгЋ_ЯОНћї№Э—3w]:uыиЕsї^ћ№г?џФчрƒF(с„Vhс…fЈс†vшс‡ †Ÿ`т‰ ^%žh""Ц(уŒ4жhу8‚wР‰0šW@=ц(фDiф‘""pЂŠф p|ИXyJ@@HfЉх–\v9"ŠЌˆЅ{(–‡azЉцšlЖŸДH@iRИу‹:ж _™у 0Ѕ›€*Ј› РwUšx(…?šј$œђ ‰zjщЅ˜оhР“т щ„И8f|Ÿ0РЈ\њ -Кh"šў™Ц*ыƒžтyЁЈ‘Оњ“n6Zщ—'Ю*ьАю•Ћ…”Fщ(„.ЖРŸj&J€„ЅkэЕо *†p @Ј'ўЪŸ$О*ю‘›ж“V‹эЛ™€@˜Ќš­„Œк*Њъ}к(]N @ЂќŽЋ+М[Kp„”’ЇlоЖW*Иo9РЂІ†люС w<Ћ‹ўxЎwkА•уЕŠqzѕКj%0яШьp/­nŒВЧL3ŽLSщтЪщЙЋ.еь Мт‰7Ÿl6жl{YnбHЖь*ЬHЛlтz?чќоСЖ}ђИЇеmndЃB РЯKОwъy­nMоЯр!Жс”W8@ЁЇ:оГЛЪlOЇюкx.о“WЎњъЗm‹tТЊц‰’фо)™:ыМїNЊеђЛЛУŽ:NБ•šg‹ыx-‡юћѓаїkКwwк§ѕић<=cgя§ї–тЎ7јф—п%фъ:oўњьпјѓлъЗ/џќ> ЗwЏЗ8<§ќїяџџ  HР№€L ШР:№`@; IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis
Products
SIMS Instrumentation
M6
The latest, multi-purpose instrument guaranteeing superior performance in all application areas.
M6 Plus
The M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.
M6 Hybrid SIMS
High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application.
Low Energy Ion Scattering
Qtac
Extremely surface sensitive instrument, providing unique and quantitative characterisation of the top atomic layer.
Software
SurfaceLab 7
Versatile instrument operation, data acquisition and data analysis software package for all IONTOF instruments.
How it works
TOF-SIMS and LEIS
Learn more about how advanced surface analysis works.
Applications
Applications
Semiconductor
The detection and quantification of trace metals is an important analytical task in the semiconductor industry.
Polymer
Discolourations on polymers are often caused by phase separation of the material's components.
Paints and Coatings
Coatings are of increasing importance for many industrial products for reasons of decoration as well as stability.
Biomaterials
The ability to image molecular compounds with high special resolution is very useful for biological applications.
Pharmaceuticals
SIMS can be used to determine the distribution of the different ingredients within pharmaceutical products.
Glass
TOF-SIMS is a very powerful technique for the analysis of non-conductive materials e.g. glass.
Paper
Paper surfaces are treated to obtain special surface properties. These modifications can be investigated.
Metals
One major advantage of TOF-SIMS is the opportunity to combine high lateral and high depth resolution.
Catalysts
For catalysis the characterisation of the top atomic layer is essential. LEIS is the ideal technique for this application.
About IONTOF
About IONTOF
IONTOF Group
Today, the IONTOF group consists of four different companies located in Germany, the USA and Japan.
News
Stay in touch with IONTOF and learn more about the latest development around our products and applications.
Events
IONTOF participates in many different conferences, workshops and other events all over the world.
Data & Facts
IONTOF's success is based on the longstanding experience in the field and the skills of our scientists and engineers.
Career Forum
If you are interested in a new challenge in an innovative working environment, IONTOF might be the place for you.
Vision
One can only be successful if deep understanding of the challenges can be combined with longstanding experience.
Policies
IONTOF is not only committed to developing products that are safe and environmentally sound.
History
Since 1989, the contribution of IONTOF to the development of the TOF-SIMS technique has been unceasing.
Support
Support
Service
When help is needed there is no time to waste.
The IONTOF service team is available.
Sales
The IONTOF sales team supports potential customers to find the best solution for their demands. Find brochures and application notes here.
Download Area
The IONTOF download area for access to the SurfaceLab software updates, helpfiles and release notes.
Virtual IONTOF User School 2024
Registration and information for the virtual IONTOF User School in May 2024 for our TOF-SIMS instrument users.
Information Request
For information about our products and services, please complete the information request form.
Customer Feedback
Help us to get even better and send us your suggestions or report any problems you experienced.
Analytical Service
For analytical service IONTOF works in a close cooperation with Tascon, specialised in analytical service.
Jobs
Aktuelle Stellenausschreibungen
Fachkraft für Export, Versand und Logistik (m/w/d)
Technischer Projektmanager / Ingenieur (m/w/d)
Bestücker / Löter / Montierer Elektronik (m/w/d)
Büroassistent (m/w/d)
Software-Entwickler (m/w/d)
Full-Stack-Entwickler für globale Workflows (m/w/d)
Elektroniker (m/w/d)
Masterarbeit
Current job openings
Technical Project Manager / Engineer (m/w/d) (full time)
Master thesis
IONTOF Customer Feedback
We strive to supply the best surface science solutions and to provide excellent after sales service to our customers.

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